IBIC microscopy – the powerful tool for testing micron – sized sensitive volumes in segmented radiation detectors used in synchrotron microbeam radiation and hadron therapies

Ion Beam Induced Charge (IBIC) microscopy performed using highly tuned microbeams of accelerated ions with energies in the MeV range is the powerful tool for analysis of charge carrier transport properties in semiconductor devices based on semiconductor hetero-junction, metal-on-semiconductor and semiconductor-on-insulator configurations. Here we present two cases of recent applications of the IBIC microscopy in the field of medical radiation physics. The reduced-rate ion microbeams with energies in the MeV range and sub-micrometer spot-sizes have been used for the investigations of the charge collection efficiency (CCE) in sensitive volumes of segmented radiation detectors in order to measure the spatial distribution and uniformity of CCE in different polarization conditions. This information allows the determination of the charge carrier transport properties in selected substructures of a particular device and to quantify its ability to accurately determine the energy deposited by incident ionizing radiation - two fundamental requirements of any microdosimeter or detector of ionizing radiation. © 2019 Elsevier B.V.

Keywords

Ion beams, Microscopy, Ionizing radiations, MeV range, Si semiconductor detectors, Semiconductor diodes, Therapy

Citation

Pastuovic, Z., Davis, J., Tran, L. T., Paino, J. R., Dipuglia, A., James, B., Povoli, M., Kok, A., Perevertaylo, V. L., Siegele, R., Prokopovich, D., Lerch, M., Petasecca, M., Rosenfeld, A., & Cohen, D. D. (2019). IBIC microscopy – the powerful tool for testing micron – sized sensitive volumes in segmented radiation detectors used in synchrotron microbeam radiation and hadron therapies. Paper Presented at the 16th International Conference on Nuclear Microprobe Technology and Applications, 8-13 July 2018, University of Surrey, Guildford, UK. In Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 458, 90-96. doi:10.1016/j.nimb.2019.08.003