IBIC microscopy – the powerful tool for testing micron – sized sensitive volumes in segmented radiation detectors used in synchrotron microbeam radiation and hadron therapies

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dc.contributor.authorPastuovic, Zen_AU
dc.contributor.authorDavis, Jen_AU
dc.contributor.authorTran, LTen_AU
dc.contributor.authorPaino, JRen_AU
dc.contributor.authorDipuglia, Aen_AU
dc.contributor.authorJames, Ben_AU
dc.contributor.authorPovoli, Men_AU
dc.contributor.authorKok, Aen_AU
dc.contributor.authorPerevertaylo, VLen_AU
dc.contributor.authorSiegele, Ren_AU
dc.contributor.authorProkopovich, DAen_AU
dc.contributor.authorLerch, MLFen_AU
dc.contributor.authorPetasecca, Men_AU
dc.contributor.authorRosenfeld, ABen_AU
dc.contributor.authorCohen, DDen_AU
dc.date.accessioned2022-02-24T01:38:07Zen_AU
dc.date.available2022-02-24T01:38:07Zen_AU
dc.date.issued2019-11-01en_AU
dc.date.statistics2022-02-03en_AU
dc.description.abstractIon Beam Induced Charge (IBIC) microscopy performed using highly tuned microbeams of accelerated ions with energies in the MeV range is the powerful tool for analysis of charge carrier transport properties in semiconductor devices based on semiconductor hetero-junction, metal-on-semiconductor and semiconductor-on-insulator configurations. Here we present two cases of recent applications of the IBIC microscopy in the field of medical radiation physics. The reduced-rate ion microbeams with energies in the MeV range and sub-micrometer spot-sizes have been used for the investigations of the charge collection efficiency (CCE) in sensitive volumes of segmented radiation detectors in order to measure the spatial distribution and uniformity of CCE in different polarization conditions. This information allows the determination of the charge carrier transport properties in selected substructures of a particular device and to quantify its ability to accurately determine the energy deposited by incident ionizing radiation - two fundamental requirements of any microdosimeter or detector of ionizing radiation. © 2019 Elsevier B.V.en_AU
dc.description.sponsorshipThis research was supported by the Australian Government through the Australian Research Council’s Discovery Projects funding scheme (project DP 170102273).en_AU
dc.identifier.citationPastuovic, Z., Davis, J., Tran, L. T., Paino, J. R., Dipuglia, A., James, B., Povoli, M., Kok, A., Perevertaylo, V. L., Siegele, R., Prokopovich, D., Lerch, M., Petasecca, M., Rosenfeld, A., & Cohen, D. D. (2019). IBIC microscopy – the powerful tool for testing micron – sized sensitive volumes in segmented radiation detectors used in synchrotron microbeam radiation and hadron therapies. Paper Presented at the 16th International Conference on Nuclear Microprobe Technology and Applications, 8-13 July 2018, University of Surrey, Guildford, UK. In Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 458, 90-96. doi:10.1016/j.nimb.2019.08.003en_AU
dc.identifier.conferenceenddate13 July 2018en_AU
dc.identifier.conferencename16th International Conference on Nuclear Microprobe Technology and Applicationsen_AU
dc.identifier.conferenceplaceUniversity of Surrey, Guildford, UKen_AU
dc.identifier.conferencestartdate8 July 2018en_AU
dc.identifier.issn0168-583Xen_AU
dc.identifier.journaltitleNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atomsen_AU
dc.identifier.pagination90-96en_AU
dc.identifier.urihttps://doi.org/10.1016/j.nimb.2019.08.003en_AU
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/12856en_AU
dc.identifier.volume458en_AU
dc.language.isoenen_AU
dc.publisherElsevier B. V.en_AU
dc.subjectIon beamsen_AU
dc.subjectMicroscopyen_AU
dc.subjectIonizing radiationsen_AU
dc.subjectMeV rangeen_AU
dc.subjectSi semiconductor detectorsen_AU
dc.subjectSemiconductor diodesen_AU
dc.subjectTherapyen_AU
dc.titleIBIC microscopy – the powerful tool for testing micron – sized sensitive volumes in segmented radiation detectors used in synchrotron microbeam radiation and hadron therapiesen_AU
dc.typeConference paperen_AU
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