Heavy ion PIXE cross sections in Ti, Zn, Nb, Ru and Ta for 4.8–30.0 MeV oxygen and 3.0–12.0 MeV lithium beams
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Date
2019-07-01
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Elsevier B. V.
Abstract
Heavy ion Particle Induced X-ray Emission (PIXE) spectroscopy offers a number of advantages over standard proton PIXE, such as higher yields and therefore higher sensitivity. However, in order to be able to use heavy ion PIXE more detailed measurements of the ionisation and X-ray cross sections for heavy ions are required. This issue was recognised by one of the Coordinated Research Projects (CRP) of the IAEA on MeV Secondary Ion Mass Spectrometry (SIMS). ANSTO took part in this CRP and we measured X-ray production cross sections on a range of samples for oxygen and lithium beam in the energy range of 4.8–30 MeV and 3–12 MeV, respectively. Here we report on these X-ray production cross section measurements and compare the results with theoretical models. Further energy shifts of the characteristic X-ray lines for the different ion-target combinations are presented and discussed. Crown Copyright © 2018 Published by Elsevier B.V.
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Keywords
Heavy ions, PIXE analysis, Spectroscopy, Titanium, Zinc, Niobium, Ruthenium, Tantalum, Oxygen, MeV range, Lithium 11 beams, Cross sections
Citation
Siegele, R., Cohen, D. D., & Pastuović̀, Z. (2019). Heavy ion PIXE cross sections in Ti, Zn, Nb, Ru and Ta for 4.8–30.0 MeV oxygen and 3.0–12.0 MeV lithium beams. Paper presented to the 23rd International Conference on Ion Beam Analysis (IBA 2017), 8 - 13 October 2017, Shanghai, China. In Shi, L., Shen, H., & Wang, X. (Eds). Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 450, 19-23. doi:10.1016/j.nimb.2018.09.017