Heavy ion PIXE cross sections in Ti, Zn, Nb, Ru and Ta for 4.8–30.0 MeV oxygen and 3.0–12.0 MeV lithium beams

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dc.contributor.authorSiegele, Ren_AU
dc.contributor.authorCohen, DDen_AU
dc.contributor.authorPastuovic, Zen_AU
dc.date.accessioned2022-02-07T05:03:11Zen_AU
dc.date.available2022-02-07T05:03:11Zen_AU
dc.date.issued2019-07-01en_AU
dc.date.statistics2022-02-04en_AU
dc.description.abstractHeavy ion Particle Induced X-ray Emission (PIXE) spectroscopy offers a number of advantages over standard proton PIXE, such as higher yields and therefore higher sensitivity. However, in order to be able to use heavy ion PIXE more detailed measurements of the ionisation and X-ray cross sections for heavy ions are required. This issue was recognised by one of the Coordinated Research Projects (CRP) of the IAEA on MeV Secondary Ion Mass Spectrometry (SIMS). ANSTO took part in this CRP and we measured X-ray production cross sections on a range of samples for oxygen and lithium beam in the energy range of 4.8–30 MeV and 3–12 MeV, respectively. Here we report on these X-ray production cross section measurements and compare the results with theoretical models. Further energy shifts of the characteristic X-ray lines for the different ion-target combinations are presented and discussed. Crown Copyright © 2018 Published by Elsevier B.V.en_AU
dc.description.sponsorshipThe authors would like to acknowledge National Collaborative Research Infrastructure Strategies (NCRIS) for funding of the Centre for Accelerator Science (CAS). This work was made possible by the IAEA CRP F11019 not least for providing the framework for this work together with the samples used.en_AU
dc.identifier.citationSiegele, R., Cohen, D. D., & Pastuović̀, Z. (2019). Heavy ion PIXE cross sections in Ti, Zn, Nb, Ru and Ta for 4.8–30.0 MeV oxygen and 3.0–12.0 MeV lithium beams. Paper presented to the 23rd International Conference on Ion Beam Analysis (IBA 2017), 8 - 13 October 2017, Shanghai, China. In Shi, L., Shen, H., & Wang, X. (Eds). Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 450, 19-23. doi:10.1016/j.nimb.2018.09.017en_AU
dc.identifier.conferenceenddate13 October 2013en_AU
dc.identifier.conferencename23rd International Conference on Ion Beam Analysis (IBA 2017)en_AU
dc.identifier.conferenceplaceShanghai, Chinaen_AU
dc.identifier.conferencestartdate8 October 2013en_AU
dc.identifier.editorsShi, L., Shen, H., & Wang, X.en_AU
dc.identifier.issn0168-583Xen_AU
dc.identifier.journaltitleNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atomsen_AU
dc.identifier.pagination19-23en_AU
dc.identifier.urihttps://doi.org/10.1016/j.nimb.2018.09.017en_AU
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/12794en_AU
dc.identifier.volume450en_AU
dc.language.isoenen_AU
dc.publisherElsevier B. V.en_AU
dc.subjectHeavy ionsen_AU
dc.subjectPIXE analysisen_AU
dc.subjectSpectroscopyen_AU
dc.subjectTitaniumen_AU
dc.subjectZincen_AU
dc.subjectNiobiumen_AU
dc.subjectRutheniumen_AU
dc.subjectTantalumen_AU
dc.subjectOxygenen_AU
dc.subjectMeV rangeen_AU
dc.subjectLithium 11 beamsen_AU
dc.subjectCross sectionsen_AU
dc.titleHeavy ion PIXE cross sections in Ti, Zn, Nb, Ru and Ta for 4.8–30.0 MeV oxygen and 3.0–12.0 MeV lithium beamsen_AU
dc.typeConference Paperen_AU
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