Provenance studies of New Zealand obsidian artefacts
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Date
1984-04
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Journal ISSN
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Publisher
Elsevier
Abstract
A large scale obsidian analysis program at the AAEC Research Establishment uses an automated facility with a multisample capacity and simultaneous PIXE and PIGME measurement. A pinhole filter in front of the PIXE detector ensures that up to 20 element concentrations can be obtained from the samples in a 5 min irradiation. Spectrum analysis and data handling procedures have been set up together with a variety of parametric and non-parametric statistical procedures. The clustering programs have been used with data from a previously measured S. W. Pacific and New Zealand obsidian source collection to identify the origin of artefact material. The example used to illustrate this program is of obsidian artefacts from the Kermadec and Chatham Islands. © 1984 Published by Elsevier B.V.
Description
Physical copy held by ANSTO Library at 539.7/33
Keywords
AAEC, PIXE analysis, Filters, Australia, Data, New Zealand, Irradiation
Citation
Duerden, P., Bird, J. R., Clayton, E., Cohen, D. D., & Leach, B. F. (1984). Provenance studies of New Zealand obsidian artefacts. Paper presented to the Third International Conference on PIXE and Its Analytical Applications : Heidelberg, Federal Republic of Germany, July 18-22, 1983. In Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 3(1), 419-423. doi:10.1016/0168-583X(84)90410-5