Provenance studies of New Zealand obsidian artefacts

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dc.contributor.authorDuerden, Pen_AU
dc.contributor.authorBird, JRen_AU
dc.contributor.authorClayton, Een_AU
dc.contributor.authorCohen, DDen_AU
dc.contributor.authorLeach, BFen_AU
dc.date.accessioned2025-05-09T03:56:46Zen_AU
dc.date.available2025-05-09T03:56:46Zen_AU
dc.date.issued1984-04en_AU
dc.date.statistics2027-02-27en_AU
dc.descriptionPhysical copy held by ANSTO Library at 539.7/33en_AU
dc.description.abstractA large scale obsidian analysis program at the AAEC Research Establishment uses an automated facility with a multisample capacity and simultaneous PIXE and PIGME measurement. A pinhole filter in front of the PIXE detector ensures that up to 20 element concentrations can be obtained from the samples in a 5 min irradiation. Spectrum analysis and data handling procedures have been set up together with a variety of parametric and non-parametric statistical procedures. The clustering programs have been used with data from a previously measured S. W. Pacific and New Zealand obsidian source collection to identify the origin of artefact material. The example used to illustrate this program is of obsidian artefacts from the Kermadec and Chatham Islands. © 1984 Published by Elsevier B.V.en_AU
dc.identifier.booktitleParticle induced x-ray emission and its analytical applications 3 : proceedings of the Third International Conference on PIXE and Its Analytical Applications : Heidelberg, Fed. Rep. Germany, July 18-22, 1983en_AU
dc.identifier.citationDuerden, P., Bird, J. R., Clayton, E., Cohen, D. D., & Leach, B. F. (1984). Provenance studies of New Zealand obsidian artefacts. Paper presented to the Third International Conference on PIXE and Its Analytical Applications : Heidelberg, Federal Republic of Germany, July 18-22, 1983. In Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 3(1), 419-423. doi:10.1016/0168-583X(84)90410-5en_AU
dc.identifier.conferenceenddate1983-07-22en_AU
dc.identifier.conferencenameThird International Conference on PIXE and Its Analytical Applicationsen_AU
dc.identifier.conferenceplaceHeidelberg, Federal Republic of Germany, July 18-22, 1983en_AU
dc.identifier.conferencestartdate1983-07-18en_AU
dc.identifier.editorsBernd Martinen_AU
dc.identifier.issn0168-583Xen_AU
dc.identifier.issue1-3en_AU
dc.identifier.journaltitleNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atomsen_AU
dc.identifier.pagination419-423en_AU
dc.identifier.urihttps://doi.org/10.1016/0168-583X(84)90410-5en_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/16160en_AU
dc.identifier.volume231 (B3)en_AU
dc.language.isoenen_AU
dc.publisherElsevieren_AU
dc.subjectAAECen_AU
dc.subjectPIXE analysisen_AU
dc.subjectFiltersen_AU
dc.subjectAustraliaen_AU
dc.subjectDataen_AU
dc.subjectNew Zealanden_AU
dc.subjectIrradiationen_AU
dc.titleProvenance studies of New Zealand obsidian artefactsen_AU
dc.typeConference Paperen_AU
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