Polarized neutron reflectometry of epitaxial Fe[0.25 + x] Pt[0.75 – x] layers.
No Thumbnail Available
Date
2018-04-27
Journal Title
Journal ISSN
Volume Title
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Epitaxial Fe[0.25 + x]Pt[0.75 - x] layers can be either antiferromagnetic (AF) or ferromagnetic (FM) depending on the degree of chemical ordering controlled by the deposition temperature. Our neutron diffraction studies were the first to study AF phase transitions in these thin films [1] and we have also shown using PNR that a mixed AF-FM film is exchange biased with itself [2]. In AF-FM exchange-biased superlattices with a modulated chemical order parameter, PNR shows the magnetization can be modulated through the film thickness with no composition modulations [3]. Our recent results reveal that He+ ion bombardment and annealing can be applied toward controlling magnetic phases in epitaxial Fe [0.25] Pt [0.75] layers [4].
© Copyright 2024 IEEE - All rights reserved, including rights for text and data mining and training of artificial intelligence and similar technologies.
Description
Keywords
Neutron diffraction, Thin Films, Ionizing radiations, Antiferromagnetism, Ferromagnetism, Epitaxy, Films
Citation
Mankey, G. J., Causer, G. L., Cortie, D. L., Wang, X., Zhu, H., Ionescu, M., & Klose, F. (2018). Polarized neutron reflectometry of epitaxial Fe[0.25 + x] Pt[0.75 – x] layers. Paper presented to the 2018 IEEE International Magnetics Conference (INTERMAG), 23-27 Apr 2018, Singapore. doi: 10.1109/INTMAG.2018.8508424