Structural characterization of ion implanted Au nanocrystals using synchrotron-based analytical techniques
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Date
2005-01-31
Journal Title
Journal ISSN
Volume Title
Publisher
Australian Institute of Physics
Abstract
Synchrotron based analytical techniques including extended x-ray absorption fine structure (EXAFS)
spectroscopy provide powerful tools for structural characterization of nanocrystalline materials. Combining these techniques with conventional analytical methods such as x-ray diffraction and transmission electron
microscopy we have investigated Au nanocrystals formed in thin SiO2 using ion implantation. Furthermore, we have studied their structural evolution following ion irradiation. Non-irradiated nanocrystals show a significant
bondlength contraction, essentially retaining the facecentred-cubic structure present in bulk material[1]. In
contrast to bulk elemental metals, which cannot be rendered amorphous by ion irradiation, irradiated
nanocrystals exhibit a significant structural change consistent with amorphous material.
Description
Keywords
Accelerators, Chalcogenides, Charged particles, Coherent scattering, Crystal lattices, Crystal structure, Diffraction, Electromagnetic radiation, Electron microscopy, Elements, Metals, Microscopy
Citation
Kluth, P., Johannessen, B., Glover, C. J., Foran, G. J., Kluth, S. M. & Ridgway, M. C. (2005). Structural characterization of ion implanted Au nanocrystals using synchrotron-based analytical techniques. Paper presented to the 29th Condensed Matter and Materials Meeting, "Australian Institute of Physics Sixteenth Biennial Congress", Canberra, 2005, 31 January - 4 February 2005.