Structural characterization of ion implanted Au nanocrystals using synchrotron-based analytical techniques

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dc.contributor.authorKluth, Pen_AU
dc.contributor.authorJohannessen, Ben_AU
dc.contributor.authorGlover, CJen_AU
dc.contributor.authorForan, GJen_AU
dc.contributor.authorKluth, SMen_AU
dc.contributor.authorRidgway, MCen_AU
dc.date.accessioned2021-09-14T02:29:59Zen_AU
dc.date.available2021-09-14T02:29:59Zen_AU
dc.date.issued2005-01-31en_AU
dc.date.statistics2021-08-24en_AU
dc.description.abstractSynchrotron based analytical techniques including extended x-ray absorption fine structure (EXAFS) spectroscopy provide powerful tools for structural characterization of nanocrystalline materials. Combining these techniques with conventional analytical methods such as x-ray diffraction and transmission electron microscopy we have investigated Au nanocrystals formed in thin SiO2 using ion implantation. Furthermore, we have studied their structural evolution following ion irradiation. Non-irradiated nanocrystals show a significant bondlength contraction, essentially retaining the facecentred-cubic structure present in bulk material[1]. In contrast to bulk elemental metals, which cannot be rendered amorphous by ion irradiation, irradiated nanocrystals exhibit a significant structural change consistent with amorphous material.en_AU
dc.identifier.citationKluth, P., Johannessen, B., Glover, C. J., Foran, G. J., Kluth, S. M. & Ridgway, M. C. (2005). Structural characterization of ion implanted Au nanocrystals using synchrotron-based analytical techniques. Paper presented to the 29th Condensed Matter and Materials Meeting, "Australian Institute of Physics Sixteenth Biennial Congress", Canberra, 2005, 31 January - 4 February 2005. en_AU
dc.identifier.conferenceenddate4 February 2005en_AU
dc.identifier.conferencename29th Condensed Matter and Materials Meeting, 'Australian Institute of Physics Sixteenth Biennial Congress'en_AU
dc.identifier.conferenceplaceCanberra, Australiaen_AU
dc.identifier.conferencestartdate31 January 2005en_AU
dc.identifier.isbn0-9598064-8-2en_AU
dc.identifier.otherASRP MOF21en_AU
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/11694en_AU
dc.language.isoenen_AU
dc.publisherAustralian Institute of Physicsen_AU
dc.subjectAcceleratorsen_AU
dc.subjectChalcogenidesen_AU
dc.subjectCharged particlesen_AU
dc.subjectCoherent scatteringen_AU
dc.subjectCrystal latticesen_AU
dc.subjectCrystal structureen_AU
dc.subjectDiffractionen_AU
dc.subjectElectromagnetic radiationen_AU
dc.subjectElectron microscopyen_AU
dc.subjectElementsen_AU
dc.subjectMetalsen_AU
dc.subjectMicroscopyen_AU
dc.titleStructural characterization of ion implanted Au nanocrystals using synchrotron-based analytical techniquesen_AU
dc.typeConference Abstracten_AU
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