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Title: Structural characterization of ion implanted Au nanocrystals using synchrotron-based analytical techniques
Authors: Kluth, P
Johannessen, B
Glover, CJ
Foran, GJ
Kluth, SM
Ridgway, MC
Keywords: Accelerators
Charged particles
Coherent scattering
Crystal lattices
Crystal structure
Electromagnetic radiation
Electron microscopy
Issue Date: 31-Jan-2005
Publisher: Australian Institute of Physics
Citation: Kluth, P., Johannessen, B., Glover, C. J., Foran, G. J., Kluth, S. M. & Ridgway, M. C. (2005). Structural characterization of ion implanted Au nanocrystals using synchrotron-based analytical techniques. Paper presented to the 29th Condensed Matter and Materials Meeting, "Australian Institute of Physics Sixteenth Biennial Congress", Canberra, 2005, 31 January - 4 February 2005. Retrieved from:
Abstract: Synchrotron based analytical techniques including extended x-ray absorption fine structure (EXAFS) spectroscopy provide powerful tools for structural characterization of nanocrystalline materials. Combining these techniques with conventional analytical methods such as x-ray diffraction and transmission electron microscopy we have investigated Au nanocrystals formed in thin SiO2 using ion implantation. Furthermore, we have studied their structural evolution following ion irradiation. Non-irradiated nanocrystals show a significant bondlength contraction, essentially retaining the facecentred-cubic structure present in bulk material[1]. In contrast to bulk elemental metals, which cannot be rendered amorphous by ion irradiation, irradiated nanocrystals exhibit a significant structural change consistent with amorphous material.
ISBN: 0-9598064-8-2
Appears in Collections:Conference Publications

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