Microspectroscopy beamline at the Australian Synchrotron
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Date
2007-01-19
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Publisher
American Institute of Physics
Abstract
This dedicated beamline will provide sub‐micron spatial resolution with the highest flux possible and an energy tuning range of 4.7–25 keV using an in‐vacuum undulator source. It will combine 2D mapping with μ‐XRF, μ‐XANES and μ‐XAFS for elemental and chemical analysis to solve scientific problems that can only be understood using sub‐micron resolutions. The primary beamline design goal is to achieve sub‐micron spatial resolution, 100–200 nm, at energy resolutions approaching 1/10000. This spatial resolution will be achieved without a major compromise to the flux, as the beamline will simultaneously achieve detection sensitivities to sub‐ppm levels. The beamline will have the flexibility to trade‐off one parameter against gains in certain attributes, as dictated by the needs of the application. Fresnel zone plates are intended for the highest resolution applications, while the KB mirrors are shall be used for applications where achromatic focusing and high sensitivity are required. The beamline design will accommodate a diverse range of applications with greatly contrasting sample formats, sample composition and anticipated detector count rates. © 2007 American Institute of Physics.
Description
Physical copy held by ANSTO at DDC: 539.735/21
Keywords
Measuring instruments, Australia, X-ray fluorescence analysis, Australian organizations, Charged particle detection, Beam optics, keV range
Citation
Paterson, D. J., Boldeman, J. W., Cohen, D. D., & Ryan, C. G. (2007). Microspectroscopy Beamline at the Australian Synchrotron. Paper presented to the Ninth International Conference on Synchrotron Radiation Instrumentation, Daegu, Korea, 28 May - 2 June 2006. In AIP Conference Proceedings, 879(1), 864-867. doi:10.1063/1.2436197