Microspectroscopy beamline at the Australian Synchrotron

Simple item page
dc.contributor.authorPaterson, DJen_AU
dc.contributor.authorBoldeman, JWen_AU
dc.contributor.authorCohen, DDen_AU
dc.contributor.authorRyan, CGen_AU
dc.date.accessioned2024-04-22T04:18:18Zen_AU
dc.date.available2024-04-22T04:18:18Zen_AU
dc.date.issued2007-01-19en_AU
dc.date.statistics2024-04-17en_AU
dc.descriptionPhysical copy held by ANSTO at DDC: 539.735/21en_AU
dc.description.abstractThis dedicated beamline will provide sub‐micron spatial resolution with the highest flux possible and an energy tuning range of 4.7–25 keV using an in‐vacuum undulator source. It will combine 2D mapping with μ‐XRF, μ‐XANES and μ‐XAFS for elemental and chemical analysis to solve scientific problems that can only be understood using sub‐micron resolutions. The primary beamline design goal is to achieve sub‐micron spatial resolution, 100–200 nm, at energy resolutions approaching 1/10000. This spatial resolution will be achieved without a major compromise to the flux, as the beamline will simultaneously achieve detection sensitivities to sub‐ppm levels. The beamline will have the flexibility to trade‐off one parameter against gains in certain attributes, as dictated by the needs of the application. Fresnel zone plates are intended for the highest resolution applications, while the KB mirrors are shall be used for applications where achromatic focusing and high sensitivity are required. The beamline design will accommodate a diverse range of applications with greatly contrasting sample formats, sample composition and anticipated detector count rates. © 2007 American Institute of Physics.en_AU
dc.identifier.citationPaterson, D. J., Boldeman, J. W., Cohen, D. D., & Ryan, C. G. (2007). Microspectroscopy Beamline at the Australian Synchrotron. Paper presented to the Ninth International Conference on Synchrotron Radiation Instrumentation, Daegu, Korea, 28 May - 2 June 2006. In AIP Conference Proceedings, 879(1), 864-867. doi:10.1063/1.2436197en_AU
dc.identifier.conferenceenddate2006-06-02en_AU
dc.identifier.conferencenameNinth International Conference on Synchrotron Radiationen_AU
dc.identifier.conferenceplaceDaegu, Koreaen_AU
dc.identifier.conferencestartdate2006-05-28en_AU
dc.identifier.isbn9780735403734en_AU
dc.identifier.issn0094-243Xen_AU
dc.identifier.issue1en_AU
dc.identifier.journaltitleAIP Conference Proceedingsen_AU
dc.identifier.pagination864-867en_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15563en_AU
dc.identifier.volume879en_AU
dc.language.isoenen_AU
dc.publisherAmerican Institute of Physicsen_AU
dc.relation.urihttps://doi.org/10.1063/1.2436197en_AU
dc.subjectMeasuring instrumentsen_AU
dc.subjectAustraliaen_AU
dc.subjectX-ray fluorescence analysisen_AU
dc.subjectAustralian organizationsen_AU
dc.subjectCharged particle detectionen_AU
dc.subjectBeam opticsen_AU
dc.subjectkeV rangeen_AU
dc.titleMicrospectroscopy beamline at the Australian Synchrotronen_AU
dc.typeConference Paperen_AU
Files
License bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
license.txt
Size:
1.63 KB
Format:
Item-specific license agreed upon to submission
Description:
Download
Collections
Conference Publications