Using x-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings

Model paint materials were generated by adding a range of inorganic materials into an epoxy. The inorganic materials included inhibitors (Zn3(PO4)2 and SrCrO4) and a filler (rutile TiO2).The SrCrO4 system was characterized using SEM, TEM, PALS and Raman spectroscopy and found to have an even distribution of inhibitor in the polymer matrix. X-ray tomography was performed on the mixed SrCrO4/TiO2 and Zn3(PO4)2/TiO2 systems. A new technique called data constrained modelling was combined with the tomographic technique to produce a 3D distribution of the inorganic phases within the polymer matrix. © 2011 Elsevier B.V.

Keywords

Raman spectroscopy, Chromates, Positron annihilation spectroscopy, Polymers, Rutile, Coatings, Scanning electron microscopy, Protective coatings

Citation

Hughes, A. E., Mayo, S., Yang, Y. S., Markley, T., Smith, S. V., Sellaiyan, S.,Uedono, A., Hardin, S. G., & Muster, T. H. (2012). Using x-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings. Progress in Organic Coatings, 74(4), 726-733. doi:10.1016/j.porgcoat.2011.06.023