Using x-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings

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dc.contributor.authorHughes, AEen_AU
dc.contributor.authorMayo, SCen_AU
dc.contributor.authorYang, YSen_AU
dc.contributor.authorMarkley, Ten_AU
dc.contributor.authorSmith, SVen_AU
dc.contributor.authorSellaiyan, Sen_AU
dc.contributor.authorUedono, Aen_AU
dc.contributor.authorHardin, SGen_AU
dc.contributor.authorMuster, THen_AU
dc.date.accessioned2018-09-14T04:08:12Zen_AU
dc.date.available2018-09-14T04:08:12Zen_AU
dc.date.issued2012-08en_AU
dc.date.statistics2018-09-10en_AU
dc.description.abstractModel paint materials were generated by adding a range of inorganic materials into an epoxy. The inorganic materials included inhibitors (Zn3(PO4)2 and SrCrO4) and a filler (rutile TiO2).The SrCrO4 system was characterized using SEM, TEM, PALS and Raman spectroscopy and found to have an even distribution of inhibitor in the polymer matrix. X-ray tomography was performed on the mixed SrCrO4/TiO2 and Zn3(PO4)2/TiO2 systems. A new technique called data constrained modelling was combined with the tomographic technique to produce a 3D distribution of the inorganic phases within the polymer matrix. © 2011 Elsevier B.V.en_AU
dc.identifier.citationHughes, A. E., Mayo, S., Yang, Y. S., Markley, T., Smith, S. V., Sellaiyan, S.,Uedono, A., Hardin, S. G., & Muster, T. H. (2012). Using x-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings. Progress in Organic Coatings, 74(4), 726-733. doi:10.1016/j.porgcoat.2011.06.023en_AU
dc.identifier.govdoc8771en_AU
dc.identifier.issn0300-9440en_AU
dc.identifier.issue4en_AU
dc.identifier.journaltitleProgress in Organic Coatingsen_AU
dc.identifier.pagination726-733en_AU
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S030094401100381Xen_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/8985en_AU
dc.identifier.volume74en_AU
dc.language.isoenen_AU
dc.publisherElsevieren_AU
dc.subjectRaman spectroscopyen_AU
dc.subjectChromatesen_AU
dc.subjectPositron annihilation spectroscopyen_AU
dc.subjectPolymersen_AU
dc.subjectRutileen_AU
dc.subjectCoatingsen_AU
dc.subjectScanning electron microscopyen_AU
dc.subjectProtective coatingsen_AU
dc.titleUsing x-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatingsen_AU
dc.typeJournal Articleen_AU
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