ANSTO Publications Online >
Journal Publications >
Journal Articles >
Please use this identifier to cite or link to this item:
|Title: ||Using X-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings|
|Authors: ||Hughes, AE|
|Keywords: ||Raman spectroscopy|
Positron annihilation spectroscopy
Scannin electron microscopy
|Issue Date: ||Aug-2012|
|Citation: ||Hughes, A. E., Mayo, S., Yang, Y. S., Markley, T., Smith, S. V., Sellaiyan, S.,Uedono, A., Hardin, S. G., & Muster, T. H. (2012). Using X-ray tomography, PALS and Raman spectroscopy for characterization of inhibitors in epoxy coatings. Progress in Organic Coatings, 74(4), 726-733. https://doi.org/10.1016/j.porgcoat.2011.06.023|
|Abstract: ||Model paint materials were generated by adding a range of inorganic materials into an epoxy. The inorganic materials included inhibitors (Zn3(PO4)2 and SrCrO4) and a filler (rutile TiO2).The SrCrO4 system was characterized using SEM, TEM, PALS and Raman spectroscopy and found to have an even distribution of inhibitor in the polymer matrix. X-ray tomography was performed on the mixed SrCrO4/TiO2 and Zn3(PO4)2/TiO2 systems. A new technique called data constrained modelling was combined with the tomographic technique to produce a 3D distribution of the inorganic phases within the polymer matrix. © 2011 Elsevier B.V.|
|Appears in Collections:||Journal Articles|
Files in This Item:
There are no files associated with this item.
Items in APO are protected by copyright, with all rights reserved, unless otherwise indicated.