Fingerprinting and source apportionment of fine particle pollution in Manila by IBA and PMF techniques: a 7-year study

Cohen, DD; Stelcer, E; Santos, FL; Prior, MJ; Thompson, C; Pabroa, PCB

Fingerprinting and source apportionment of fine particle pollution in Manila by IBA and PMF techniques: a 7-year study

Date

2009-01

Authors

Publisher

Wiley-Blackwell

Abstract

X-ray and ion beam analysis (IBA) techniques have been used to characterize fine particle pollution in Manila over a 7-year period. These data have then been used in the latest statistical methods of positive matrix factorization (PMF) to quantitatively identify source fingerprints and their contributions to the total fine particulate mass. © 2008, Wiley-Blackwell.

Keywords

Pattern recognition, Pollution, Ion beams, Statistical models, Factorization, Particulates

Citation

Cohen, D. D., Stelcer, E., Santos, F. L., Prior, M., Thompson, C., & Pabroa, P. C. B. (2009). Fingerprinting and source apportionment of fine particle pollution in Manila by IBA and PMF techniques: a 7-year study. X-Ray Spectrometry, 38(1), 18-25. doi:10.1002/xrs.1112