Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

Owing to its extreme sensitivity, quantitative mapping of elemental distributionsviaX-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated. © International Union of Crystallography.

Keywords

Fluorescence, Diffraction, Microscopy, Synchrotrons, Elements, Microanalysis, Australian organizations, ANSTO, Vibrational states, Decomposition, Data

Citation

Jones, M. W. M., Phillips, N. W., van Riessen, G. A., Abbey, B., Vine, D. J., Nashed, Y. S. G., Mudie, S. T., Afshar, N., Kirkham, R., Chen, B., Balaur, E., & de Jonge, M. D. (2016). Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline. Journal of Synchrotron Radiation, 23(5), 1151–1157. doi:10.1107/S1600577516011917vibr