Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

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dc.contributor.authorJones, MWMen_AU
dc.contributor.authorPhillips, NWen_AU
dc.contributor.authorvan Riessen, GAen_AU
dc.contributor.authorAbbey, Ben_AU
dc.contributor.authorVine, DJen_AU
dc.contributor.authorNashed, YSGen_AU
dc.contributor.authorMudie, STen_AU
dc.contributor.authorAfshar, Nen_AU
dc.contributor.authorKirkham, Ren_AU
dc.contributor.authorChen, Ben_AU
dc.contributor.authorBalaur, Een_AU
dc.contributor.authorde Jonge, MDen_AU
dc.date.accessioned2025-10-14T23:06:42Zen_AU
dc.date.available2025-10-14T23:06:42Zen_AU
dc.date.issued2016-09en_AU
dc.date.statistics2025-10-14en_AU
dc.description.abstractOwing to its extreme sensitivity, quantitative mapping of elemental distributionsviaX-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated. © International Union of Crystallography.en_AU
dc.description.sponsorshipWe thank Dectris Ltd, Baden, Switzerland, for loan of the EIGER X 1M detector. This research was undertaken on the XFM beamline at the Australian Synchrotron, Victoria, Australia, and supported by the Multi-modal Australian ScienceS Imaging and Visualization Environment (MASSIVE) (https://www.massive.org.au). The authors acknowledge the support of the Australian Research Council (ARC) Centre of Excellence for Advanced Molecular Imaging. This work was performed in part at the Melbourne Centre for Nanofabrication (MCN) in the Victorian Node of the Australian National Fabrication Facility (ANFF).en_AU
dc.format.mediumPrint-Electronicen_AU
dc.identifier.citationJones, M. W. M., Phillips, N. W., van Riessen, G. A., Abbey, B., Vine, D. J., Nashed, Y. S. G., Mudie, S. T., Afshar, N., Kirkham, R., Chen, B., Balaur, E., & de Jonge, M. D. (2016). Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline. Journal of Synchrotron Radiation, 23(5), 1151–1157. doi:10.1107/S1600577516011917vibren_AU
dc.identifier.issn0909-0495en_AU
dc.identifier.issn1600-5775en_AU
dc.identifier.issue5en_AU
dc.identifier.journaltitleJournal of Synchrotron Radiationen_AU
dc.identifier.pagination1151-1157en_AU
dc.identifier.urihttps://doi.org/10.1107/s1600577516011917en_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/16601en_AU
dc.identifier.volume23en_AU
dc.languageengen_AU
dc.language.isoenen_AU
dc.publisherInternational Union of Crystallographyen_AU
dc.subjectFluorescenceen_AU
dc.subjectDiffractionen_AU
dc.subjectMicroscopyen_AU
dc.subjectSynchrotronsen_AU
dc.subjectElementsen_AU
dc.subjectMicroanalysisen_AU
dc.subjectAustralian organizationsen_AU
dc.subjectANSTOen_AU
dc.subjectVibrational statesen_AU
dc.subjectDecompositionen_AU
dc.subjectDataen_AU
dc.titleSimultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamlineen_AU
dc.typeJournal Articleen_AU
dcterms.dateAccepted2016-07-21en_AU
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