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Title: Characterisation of embedded nano-precipitates by X-ray diffraction imaging and small-angle X-ray scattering
Authors: Pelliccia, D
Andrei, YN
Kirby, N
Hester, JR
Keywords: X-ray diffraction
Issue Date: 2014
Publisher: InderScience Publishers
Citation: Pelliccia, P., Nikulin, A. Y., Kirby, N., & Hester, J. (2014). Characterisation of embedded nano-precipitates by x-ray diffraction imaging and small-angle x-ray scattering. International Journal of Nanotechnology, 11(5-8), 549-554. doi:10.1504/IJNT.2014.060576
Abstract: We report on the characterisation of embedded Al2Cu nanoparticles in Al matrix by X-ray diffraction imaging and small-angle X-ray scattering. We employed direct retrieval of the average morphological characteristics of the nanoparticles from their diffraction pattern. Data suggest the possibility of acquiring truly 3D information with X-ray diffraction imaging. Validation of the results obtained with small-angle X-ray scattering is reported. © 2020 Inderscience Enterprises Ltd.
Gov't Doc #: 7321
ISSN: 2056-4058
Appears in Collections:Journal Articles

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