Characterisation of embedded nano-precipitates by x-ray diffraction imaging and small-angle x-ray scattering

Pelliccia, D; Andrei, YN; Kirby, N; Hester, JR

Characterisation of embedded nano-precipitates by x-ray diffraction imaging and small-angle x-ray scattering

Date

2014

Authors

Publisher

InderScience Publishers

Abstract

We report on the characterisation of embedded Al2Cu nanoparticles in Al matrix by X-ray diffraction imaging and small-angle X-ray scattering. We employed direct retrieval of the average morphological characteristics of the nanoparticles from their diffraction pattern. Data suggest the possibility of acquiring truly 3D information with X-ray diffraction imaging. Validation of the results obtained with small-angle X-ray scattering is reported. © 2020 Inderscience Enterprises Ltd.

Keywords

X-ray diffraction, Data, Morphology, Validation, Scattering, Particles

Citation

Pelliccia, P., Nikulin, A. Y., Kirby, N., & Hester, J. (2014). Characterisation of embedded nano-precipitates by x-ray diffraction imaging and small-angle x-ray scattering. International Journal of Nanotechnology, 11(5-8), 549-554. doi:10.1504/IJNT.2014.060576