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|Title: ||Characterisation of embedded nano-precipitates by X-ray diffraction imaging and small-angle X-ray scattering|
|Authors: ||Pelliccia, D|
|Keywords: ||X-RAY DIFFRACTION|
|Issue Date: ||2014|
|Publisher: ||InderScience Publishers|
|Citation: ||Pelliccia, P., Nikulin, A. Y., Kirby, N., & Hester, J. (2014). Characterisation of embedded nano-precipitates by X-ray diffraction imaging and small-angle X-ray scattering. International Journal of Nanotechnology, 11(5-8), 549-554. doi: http://dx.doi.org/10.1504/IJNT.2014.060576|
|Abstract: ||We report on the characterisation of embedded Al2Cu nanoparticles in Al matrix by X-ray diffraction imaging and small-angle X-ray scattering. We employed direct retrieval of the average morphological characteristics of the nanoparticles from their diffraction pattern. Data suggest the possibility of acquiring truly 3D information with X-ray diffraction imaging. Validation of the results obtained with small-angle X-ray scattering is reported.|
|Appears in Collections:||Journal Articles|
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