Characterisation of embedded nano-precipitates by x-ray diffraction imaging and small-angle x-ray scattering

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dc.contributor.authorPelliccia, Den_AU
dc.contributor.authorAndrei, YNen_AU
dc.contributor.authorKirby, Nen_AU
dc.contributor.authorHester, JRen_AU
dc.date.accessioned2016-10-17T05:38:31Zen_AU
dc.date.available2016-10-17T05:38:31Zen_AU
dc.date.issued2014en_AU
dc.date.statistics2016-10-17en_AU
dc.description.abstractWe report on the characterisation of embedded Al2Cu nanoparticles in Al matrix by X-ray diffraction imaging and small-angle X-ray scattering. We employed direct retrieval of the average morphological characteristics of the nanoparticles from their diffraction pattern. Data suggest the possibility of acquiring truly 3D information with X-ray diffraction imaging. Validation of the results obtained with small-angle X-ray scattering is reported. © 2020 Inderscience Enterprises Ltd.en_AU
dc.identifier.citationPelliccia, P., Nikulin, A. Y., Kirby, N., & Hester, J. (2014). Characterisation of embedded nano-precipitates by x-ray diffraction imaging and small-angle x-ray scattering. International Journal of Nanotechnology, 11(5-8), 549-554. doi:10.1504/IJNT.2014.060576en_AU
dc.identifier.govdoc7321en_AU
dc.identifier.issn2056-4058en_AU
dc.identifier.issue5-8en_AU
dc.identifier.journaltitleInternational Journal of Nanotechnologyen_AU
dc.identifier.pagination549-554en_AU
dc.identifier.urihttp://dx.doi.org/10.1504/IJNT.2014.060576en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/7759en_AU
dc.identifier.volume11en_AU
dc.language.isoenen_AU
dc.publisherInderScience Publishersen_AU
dc.subjectX-ray diffractionen_AU
dc.subjectDataen_AU
dc.subjectMorphologyen_AU
dc.subjectValidationen_AU
dc.subjectScatteringen_AU
dc.subjectParticlesen_AU
dc.titleCharacterisation of embedded nano-precipitates by x-ray diffraction imaging and small-angle x-ray scatteringen_AU
dc.typeJournal Articleen_AU
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