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Title: Effect of vacuum annealing on the phase stability of Ti3SiC2.
Authors: Low, IM
Oo, Z
Prince, KE
Keywords: Annealing
Phase stability
X-ray diffraction
Neutron diffraction
Synchrotron radiation
Mass spectroscopy
Issue Date: Aug-2007
Publisher: Wiley-Blackwell
Citation: Low, I. M., Oo, Z., & Prince, K. E. (2007). Effect of vacuum annealing on the phase stability of Ti3SiC2. Journal of the American Ceramic Society, 90(8), 2610-2614. doi:10.1111/j.1551-2916.2007.01817.x
Abstract: The effect of vacuum annealing on the thermal stability and phase transition of Ti3SiC2 has been investigated by X-ray diffraction (XRD), neutron diffraction, synchrotron radiation diffraction, and secondary ion mass spectroscopy (SIMS). In the presence of vacuum or a controlled atmosphere of low oxygen partial pressure, Ti3SiC2 undergoes a surface dissociation to form nonstoichiometric TiC and/or Ti5Si3Cx that commences at ~1200°C and becomes very pronounced at ≥ 1500°C. Composition depth profiling at the near surface of vacuum-annealed Ti3SiC2 by XRD and SIMS revealed a distinct gradation in the phase distribution of TiC and Ti5Si3Cx with depth. © 2007, Wiley-Blackwell. The definitive version is available at
Gov't Doc #: 1138
ISSN: 0002-7820
Appears in Collections:Journal Articles

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