Using polarized neutron reflectometry to resolve effects of light elements and ion exposure on magnetization

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dc.contributor.authorCallori, SJen_AU
dc.contributor.authorSaerbeck, Ten_AU
dc.contributor.authorCortie, DLen_AU
dc.contributor.authorLin, KWen_AU
dc.date.accessioned2024-02-27T23:56:17Zen_AU
dc.date.available2024-02-27T23:56:17Zen_AU
dc.date.issued2020en_AU
dc.date.statistics2024-02-28en_AU
dc.description.abstractThis chapter introduces the polarized neutron reflectometry (PNR) technique with a focus on its unique applications to studying the effects of light elements and ion beams in magnetic thin films. The chapter is divided into six sections. Following a brief introduction in Section 1, Section 2 introduces the operational principles and advantages of PNR. Section 3 discusses recent experiments on magnetic hydrogen sensors using in-situ magnetic measurements made on a PNR beam line. Section 4 reviews recent progress using PNR to clarify how low-energy ion beams can modulate the magnetic properties by implantation, modifying oxygen stoichiometry, interface engineering with argon, and imprinting magnetic domains by driving phase transitions. Section 5 exemplifies how PNR can be used to study lateral magnetic domain structures patterned using helium ion beams. Section 6 presents conclusions and future perspectives in form of a brief roadmap highlighting some of the latest developments in PNR, and the new technical possibilities that are anticipated over the coming decade. © 2020 Elsevier Inc.en_AU
dc.identifier.booktitleSolid State Physicsen_AU
dc.identifier.chapterThreeen_AU
dc.identifier.citationCallori, S. J., Saerbeck, T., Cortie, D. L., & Lin, K.-W. (2020). Chapter Three - Using polarized neutron reflectometry to resolve effects of light elements and ion exposure on magnetization. In R. L. Stamps (Ed.), Solid State Physics (Vol. 71, pp. 73-116). Academic Press. doi:10.1016/bs.ssp.2020.09.002en_AU
dc.identifier.editorsR. L. Stampsen_AU
dc.identifier.isbn9780128220238en_AU
dc.identifier.issn0081-1947en_AU
dc.identifier.pagination73-116en_AU
dc.identifier.urihttp://dx.doi.org/10.1016/bs.ssp.2020.09.002en_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15460en_AU
dc.identifier.volume71en_AU
dc.language.isoenen_AU
dc.publisherElsevieren_AU
dc.relation.ispartofseriesSolid State Physicsen_AU
dc.subjectNeutron reflectorsen_AU
dc.subjectLight Sourcesen_AU
dc.subjectIonsen_AU
dc.subjectMagnetizationen_AU
dc.subjectIon beamsen_AU
dc.subjectHelium ionsen_AU
dc.subjectOxygenen_AU
dc.subjectThin Filmsen_AU
dc.subjectStoichiometryen_AU
dc.titleUsing polarized neutron reflectometry to resolve effects of light elements and ion exposure on magnetizationen_AU
dc.typeBook chapteren_AU
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