Characterisation of methane plasma treated carbon surfaces

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dc.contributor.authorDeslandes, Aen_AU
dc.contributor.authorJasieniak, Men_AU
dc.contributor.authorIonescu, Men_AU
dc.contributor.authorShapter, JGen_AU
dc.contributor.authorQuinton, JSen_AU
dc.date.accessioned2025-01-14T00:24:42Zen_AU
dc.date.available2025-01-14T00:24:42Zen_AU
dc.date.issued2008-02-25en_AU
dc.date.statistics2025-01en_AU
dc.description.abstractTime of Flight Secondary ion Mass Spectrometry (ToF-SIMS) was used to investigate the chemical nature of methane plasma treated graphite surfaces. Principle Component Analysis (PCA) was applied to the SIMS data, revealing chemical changes to the surfaces, in particular the extent of hydrogenation. The hydrogen content of the HOPG surface is observed to increase with systematic increases in power of the plasma treatment. These results are supported by Elastic Recoil Detection Analysis (ERDA) measurements that show a similar increase in hydrogen content. Scanning Tunneling Microscopy (STM) measurements provide insight into the morphological changes to the surface caused by the treatment, via investigating plasma-created features that are observed to increase in coverage with the increases in plasma power. © 2008 IEEE.en_AU
dc.identifier.booktitleICONN 2008 : proceedings of the 2008 International Conference on Nanoscience and Nanotechnology, 25-29 February 2008, Melbourne, Australiaen_Au
dc.identifier.citationDeslandes, A., Jasieniak, M., Ionescu, M., Shapter, J. G., & Quinton, J. S. (2008, 25-29 Feb. 2008). Characterisation of methane plasma treated carbon surfaces. Paper presented to the ICONN 2008 : International Conference on Nanoscience and Nanotechnology, 25-29 February 2008, Melbourne, Australia. In ICONN 2008 : proceedings of the 2008 International Conference on Nanoscience and Nanotechnology, 25-29 February 2008, Melbourne, Australia, (pp. 24-27). Piscataway, N.J. : IEEE. doi,:10.1109/ICONN.2008.4639236en_AU
dc.identifier.conferenceenddate2008-02-29en_AU
dc.identifier.conferencename2008 International Conference on Nanoscience and Nanotechnologyen_AU
dc.identifier.conferenceplaceMelbourne, Australiaen_AU
dc.identifier.conferencestartdate2008-02-25en_AU
dc.identifier.isbn9781424415045en_AU
dc.identifier.isbn1424415047en_AU
dc.identifier.pagination24-27en_AU
dc.identifier.urihttps://doi.org/10.1109/iconn.2008.4639236en_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15938en_AU
dc.publisherInstitute of Electrical and Electronics Engineersen_AU
dc.subjectTime-of-flight mass spectrometersen_AU
dc.subjectPlasmaen_AU
dc.subjectGraphiteen_AU
dc.subjectHydrogenationen_AU
dc.subjectHydrogenen_AU
dc.subjectScanning tunneling microscopyen_AU
dc.subjectMorphologyen_AU
dc.titleCharacterisation of methane plasma treated carbon surfacesen_AU
dc.typeConference Paperen_AU
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