Characterisation of methane plasma treated carbon surfaces
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Date
2008-02-25
Journal Title
Journal ISSN
Volume Title
Publisher
Institute of Electrical and Electronics Engineers
Abstract
Time of Flight Secondary ion Mass Spectrometry (ToF-SIMS) was used to investigate the chemical nature of methane plasma treated graphite surfaces. Principle Component Analysis (PCA) was applied to the SIMS data, revealing chemical changes to the surfaces, in particular the extent of hydrogenation. The hydrogen content of the HOPG surface is observed to increase with systematic increases in power of the plasma treatment. These results are supported by Elastic Recoil Detection Analysis (ERDA) measurements that show a similar increase in hydrogen content. Scanning Tunneling Microscopy (STM) measurements provide insight into the morphological changes to the surface caused by the treatment, via investigating plasma-created features that are observed to increase in coverage with the increases in plasma power. © 2008 IEEE.
Description
Keywords
Time-of-flight mass spectrometers, Plasma, Graphite, Hydrogenation, Hydrogen, Scanning tunneling microscopy, Morphology
Citation
Deslandes, A., Jasieniak, M., Ionescu, M., Shapter, J. G., & Quinton, J. S. (2008, 25-29 Feb. 2008). Characterisation of methane plasma treated carbon surfaces. Paper presented to the ICONN 2008 : International Conference on Nanoscience and Nanotechnology, 25-29 February 2008, Melbourne, Australia. In ICONN 2008 : proceedings of the 2008 International Conference on Nanoscience and Nanotechnology, 25-29 February 2008, Melbourne, Australia, (pp. 24-27). Piscataway, N.J. : IEEE. doi,:10.1109/ICONN.2008.4639236