In situ applications of soft x-ray ptychography

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dc.contributor.authorvan Riessen, GAen_AU
dc.contributor.authorJames, Men_AU
dc.contributor.authorvan Riessen, Aen_AU
dc.contributor.authorPhillips, NWen_AU
dc.contributor.authorde Jonge, MDen_AU
dc.contributor.authorKourousias, Gen_AU
dc.contributor.authorGiamoncelli, Aen_AU
dc.contributor.authorBozzini, Ben_AU
dc.date.accessioned2023-01-27T00:58:58Zen_AU
dc.date.available2023-01-27T00:58:58Zen_AU
dc.date.issued2016-02-04en_AU
dc.date.statistics2022-11-04en_AU
dc.description.abstractCoherent diffractive imaging (CDI) with synchrotron X-ray beams allows extended objects to be characterised at high spatial resolution (<30 nm) and high energy resolution (0.1 eV). In an implementation of CDI known as ptychography, a far-field diffraction pattern is measured from many overlapping regions as the sample is scanned through a coherent X-ray beam. Quantitative images of an object are then obtained from the far-field intensity pattern through iterative reconstruction algorithms. This provides a unique method of studying the elemental and chemical-state distributions in relatively thick materials and their relationship to nanoscale morphology. The high coherent flux offered by synchrotron X-ray sources can also potentially allow high temporal resolution through the use of emerging detector technology and advanced image reconstruction algorithms. This in turn allows the nanoscale structure of functional materials to be studied under non-equilibrium real-time conditions. In this work, we review recent efforts to apply soft X-ray ptychography to in situ and operando applications at several synchrotron facilities. We emphasise studies of functional materials that are characterised by heterogeneity over a range of relevant length scales, including energy storage materials based on polypyrrole nanocomposites and inorganic, aluminosilicate based ceramics. Finally, a perspective on the future prospects of the method will be given, with particular attention to how experimental challenges can be overcome to achieve the spatiotemporal resolution limits defined by the available coherent flux from synchrotron light sources.en_AU
dc.identifier.citationvan Riessen, G., James, M., van Riessen, A., Phillips, N., de Jonge, M., Kourousias, G., Giamoncelli, A., Bozzini, B. (2016). In situ applications of soft x-ray ptychography. Paper presented to ACMM24 : Australian Conference on Microscopy and Analysis : Melbourne Convention and Exhibition Centre, 31 Jan-4 Feb 2016, (pp. 65).en_AU
dc.identifier.conferenceenddate4 February 2016en_AU
dc.identifier.conferencenameACMM24 : Australian Conference on Microscopy and Analysisen_AU
dc.identifier.conferenceplaceMelbourne, Australiaen_AU
dc.identifier.conferencestartdate31 January 2016en_AU
dc.identifier.isbn9780980337334en_AU
dc.identifier.pagination65en_AU
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/14532en_AU
dc.language.isoenen_AU
dc.publisherAustralian Microscopy and Microanalysis Societyen_AU
dc.subjectIn-situ processingen_AU
dc.subjectDiffractionen_AU
dc.subjectBeamsen_AU
dc.subjectMorphologyen_AU
dc.subjectSynchrotronsen_AU
dc.subjectLight sourcesen_AU
dc.subjectSynchrotron radiation sourcesen_AU
dc.titleIn situ applications of soft x-ray ptychographyen_AU
dc.typeConference Abstracten_AU
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