New modes of THz generation by low-temperature-grown GaAsSb
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Date
2009-02
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
The low-temperature growth of GaAs1−ySby with y = 0.4 and 0.85 has been reported recently along with characterization by X-ray diffraction, Hall, and current–voltage measurements. Here we extend the characterization by employing reflectance spectroscopy in the range 5–18 THz to confirm the compositions of the grown layers. In the course of this work we established for the first time that GaAs1−ySby may serve as an emitter of THz radiation under optical excitation by ultrashort pulses of near-infrared radiation in two distinct experimental arrangements: THz is generated when an electrical bias is applied through a simple electrode structure, attributed to a photoconductive effect; and THz is generated by the pristine layers themselves, attributed to a surface-field effect. In each case the THz emission is compared directly with that from low-temperature-grown GaAs. The results presented here are for as-grown material. Suitable annealing may improve the THz emission even further. © 2009, Elsevier Ltd.
Description
Keywords
THz range, X-ray diffraction, Electric potential, Layers, Gallium arsenides, Infrared radiation
Citation
Hargreaves, S., Bignell, L. J., Lewis, R. A., Sigmund, J., & Hartnagel, H. L. (2009). New modes of THz generation by low-temperature-grown GaAsSb. Solid-State Electronics, 53(2), 160-165. doi:10.1016/j.sse.2008.10.015