Sol-gel tungsten oxide/titanium oxide multilayer nanoheterostructured thin films: structural and photoelectrochemical properties

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dc.contributor.authorLuca, Ven_AU
dc.contributor.authorBlackford, MGen_AU
dc.contributor.authorFinnie, KSen_AU
dc.contributor.authorEvans, PJen_AU
dc.contributor.authorJames, Men_AU
dc.contributor.authorLindsay, MJen_AU
dc.contributor.authorSkyllas-Kazacos, Men_AU
dc.contributor.authorBarnes, PRFen_AU
dc.date.accessioned2008-04-28T02:52:53Zen_AU
dc.date.accessioned2010-04-30T05:02:55Zen_AU
dc.date.available2008-04-28T02:52:53Zen_AU
dc.date.available2010-04-30T05:02:55Zen_AU
dc.date.issued2007-12-20en_AU
dc.date.statistics2007-12en_AU
dc.description.abstractMultilayer structures of alternating thin titanium and tungsten oxide layers having dimensions of similar to 20 nm have been fabricated from titanium alkoxide and various tungstate precursor solutions using the dip coating technique. Single, double, and triple layer titanate and tungstate thin films were deposited on silicon substrates, and these films were initially annealed at 400°C. Structural and microstructural aspects of the films were investigated using a variety of techniques, including X-ray reflectometry, grazing incidence X-ray absorption spectroscopy (GIXAS), cross-sectional transmission electron microscopy (TEM), and secondary ion mass spectrometry. The dimensions of the films and the character of the interfaces were principally gauged by cross-sectional TEM and X-ray reflectometery. All films were continuous on a local scale and had relatively low surface roughness. At the treatment temperature of 400°C, only the tungsten oxide component showed appreciable crystallinity. The multilayer films had relatively diffuse interfaces, even after annealing in air at this temperature. At these temperatures, easily measurable diffusion of tungsten into the titanium oxide component was observed, whereas the diffusion of titanium into the tungsten oxide component occurred to a lesser degree. At higher temperatures, interdiffusion of components was found to be significant. TEM, X-ray diffraction, and Ti K-edge GIXAS measurements indicated that annealing at 400°C generated films in which the titanate component remained amorphous while the tungstate component crystallized in the tetragonal modification Of WO3, which is normally stable only at high temperatures. Grazing incidence X-ray absorption spectroscopy allowed the degree of distortion of the tungsten oxygen polyhedra to be monitored as a function of depth into the film. The photoelectrochernical activity of the multilayer film electrodes was investigated, and the activity for water photo-oxidation was assessed. The photoelectrochernical response was greatest when crystalline WO3 was bounded on both sides by amorphous TiO2 layers. In this bounded state, WO3 had unique structural characteristics. © 2007, American Chemical Societyen_AU
dc.identifier.citationLuca, V., Blackford, M. G., Finnie, K. S., Evans, P. J., James, M., Lindsay, M. J., Skyllas-Kazacos, M., & Barnes, P. R. F. (2007). Sol-gel tungsten oxide/titanium oxide multilayer nanoheterostructured thin films: structural and photoelectrochemical properties. Journal of Physical Chemistry C, 111(50), 18479-18492. doi:10.1021/jp0729112en_AU
dc.identifier.govdoc1186en_AU
dc.identifier.issn1932-7447en_AU
dc.identifier.issue50en_AU
dc.identifier.journaltitleJournal of Physical Chemistry Cen_AU
dc.identifier.pagination18479-18492en_AU
dc.identifier.urihttp://dx.doi.org/10.1021/jp0729112en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/1128en_AU
dc.identifier.volume111en_AU
dc.language.isoenen_AU
dc.publisherAmerican Chemical Societyen_AU
dc.subjectAbsorptionen_AU
dc.subjectVisible radiationen_AU
dc.subjectOptical propertiesen_AU
dc.subjectHydrogen transferen_AU
dc.subjectTitaniumen_AU
dc.subjectTungstenen_AU
dc.titleSol-gel tungsten oxide/titanium oxide multilayer nanoheterostructured thin films: structural and photoelectrochemical propertiesen_AU
dc.typeJournal Articleen_AU
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