Determination of the residual stress field around scratches using synchrotron x-rays and nanoindentation.

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dc.contributor.authorKhan, MKen_AU
dc.contributor.authorFitzpatrick, MEen_AU
dc.contributor.authorEdwards, Len_AU
dc.contributor.authorHainsworth, SVen_AU
dc.date.accessioned2010-08-30T05:38:03Zen_AU
dc.date.available2010-08-30T05:38:03Zen_AU
dc.date.issued2009-11-10en_AU
dc.date.statistics2009-11-10en_AU
dc.description.abstractThe residual strain field around the scratches of 125µm depth and 5µm root radius have been measured from the Synchrotron X-ray diffraction. Scratches were produced using different tools in fine-grained aluminium alloy AA 5091. Residual stresses up to +1700 micro-strains were measured at the scratch tip for one tool but remained up to only +1000 micro-strains for the other tool scratch. The load-displacement curves obtained from nanoindentation were used to determine the residual stresses around the scratches. It was found that the load-displacement curves are sensitive to any local residual stress field present and behave according to the type of residual stresses. This combination of nanoindentation and synchrotron X-rays has been proved highly effective for the study of small-scale residual stresses around the features such as scratches. © 2020 by Trans Tech Publications Ltd.en_AU
dc.identifier.citation Khan, M. K., Fitzpatrick, M. E., Edwards, L. E., & Hainsworth, S. V. (2010). Determination of the Residual Stress Field around Scratches Using Synchrotron X-Rays and Nanoindentation. Paper presented to the 5th International Conference on Mechanical Stress Evaluation by Neutrons and Synchrotron Radiation, MECA SENS V/3rd International Symposium of Quantum Beam Science Directorate of Japan Atomic Energy Agency. In Materials Science Forum, 652, 25–30. Trans Tech Publications, Ltd. doi:10.4028/www.scientific.net/msf.652.25en_AU
dc.identifier.conferenceenddate12 November 2009en_AU
dc.identifier.conferencename5th International Conference on Mechanical Stress Evaluation by Neutrons and Synchrotron Radiation, MECA SENS V/3rd International Symposium of Quantum Beam Science Directorate of Japan Atomic Energy Agencyen_AU
dc.identifier.conferenceplaceMito, Japanen_AU
dc.identifier.conferencestartdate10 November 2009en_AU
dc.identifier.govdoc2545en_AU
dc.identifier.isbn0878492585en_AU
dc.identifier.issn0255-5476en_AU
dc.identifier.journaltitleMaterials Research Forumen_AU
dc.identifier.pagination25-30en_AU
dc.identifier.urihttp://dx.doi.org/10.4028/www.scientific.net/MSF.652.25en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/2365en_AU
dc.identifier.volume562en_AU
dc.language.isoenen_AU
dc.publisherTrans Tech Publicationsen_AU
dc.subjectResidual stressesen_AU
dc.subjectDamageen_AU
dc.subjectX-ray diffractionen_AU
dc.subjectCrack propagationen_AU
dc.subjectFatigueen_AU
dc.subjectSynchrotronsen_AU
dc.titleDetermination of the residual stress field around scratches using synchrotron x-rays and nanoindentation.en_AU
dc.typeConference Paperen_AU
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