Characterisation and application of a SPLEED-based spin polarisation analyser
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Date
2007-12-15
Journal Title
Journal ISSN
Volume Title
Publisher
Elsevier
Abstract
A commercial electron spin analyser, based on spin-polarised low-energy electron diffraction (SPLEED) from W(100), has been characterised with incident polarised electron beams from a standard GaAs polarised electron source. The dependence of the Sherman function on the scattering energy and elapse time after CO-flash of the tungsten crystal of the analyser have been measured. The influence of the stray magnetic field on the performance of the analyser has been investigated. The spin analyser has been applied in monitoring the reorientation transition of the easy magnetisation direction of Fe films on W(110) upon the exposure of CO adsorbent on the surface. © 2007, Elsevier Ltd.
Description
Keywords
Electron spin resonance, Polarization, Diffraction, Electron diffraction, Energy, Photoemission
Citation
Yu, D. H., Math, C., Meier, M., Escher, M., Rangelov, G., & Donath, M. (2007). Characterisation and application of a SPLEED-based spin polarisation analyser. Surface Science, 601, 5803-5808. doi:10.1016/j.susc.2007.06.061