LET dependence of the charge collection efficiency of silicon microdosimeters
Loading...
Date
Journal Title
Journal ISSN
Volume Title
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Abstract
A heavy ion microprobe was used to conduct ion beam induced charge (IBIC) collection imaging of silicon microdosimeters. The GEANT4 Monte Carlo toolkit was used to simulate these measurements to calculate ion energy loss in the device overlayer and energy deposition in the device sensitive volume. A comparison between experimental and theoretical results facilitated the calculation of charge collection efficiency profiles for several ions. © 2025 IEEE
Description
Citation
Cornelius, I. M., Rosenfeld, A. B., Siegele, R., & Cohen, D. D. (2003). LET dependence of the charge collection efficiency of silicon microdosimeters. Paper presented to the 40th Annual Nuclear and Space Raduiation Effects Conference (NSREC), July 21-25, 2003, Monetery, CA. In IEEE Transactions on Nuclear Science, 50(6), 2373-2379. doi:10.1109/TNS.2003.820740