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Attenuated total reflection FTIR microspectroscopy at the Australian Synchrotron

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Date

2016-11-14

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Optica Publishing Group

Abstract

ATR FTIR microspectroscopy enables the analysis of samples with lateral resolution greater than is possible by transmission FTIR. ATR accessories have been developed for the study of materials with multilayer coatings and fine surface structures. © 2016 Optical Society of America

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Keywords

Reflection, Spectroscopy, ANSTO, Australian organizations, Coatings, Surfaces, Structure factors, Beams, Sample preparation, Measuring instruments

Citation

Tobin, M. J., Bambery, K. R., Martin, D. E., Puskar, L., Beattie, D. A., Ivanova, E. P., Nguyen, S.-H., Webb, H. K., & Vongsvivut, J. (2016). Attenuated total reflection FTIR microspectroscopy at the Australian Synchrotron. Paper presented to the Fourier Transform Spectroscopy Meeting, 14-17 November 2026, Leipzig, Germany. In Optics and Photonics for Energy and the Environment : part of Light, Energy and the Environment : 14-17 November 2016, Leipzig, Germany. Retrieved from: https://opg.optica.org/abstract.cfm?URI=FTS-2016-FTu2E.5

URI

https://doi.org/10.1364/fts.2016.ftu2e.5
 https://apo.ansto.gov.au/handle/10238/17218

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