Radiation test of rad-hard ICs for space applications
Loading...
Date
2021-11-26
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Australian Nuclear Science and Technology Organisation
Abstract
Conventional Integrated Circuits (IC) are highly sensitive to radiation effects and can operate only in environments with a very low level of radiation. High radiation environments such as space need custom-designed ICs with dedicated radiation-hardened architectures. Our research is focused on the development and test of radiation-hardened ICs in nanoscale and ultra-low-power semiconductor technologies for high radiation environments such as in space and particle physics experiments. The University of Melbourne and Ansto developed a strategic collaboration to enable the ANSTO's heavy ion microprobe beamline for radiation test of custom-designed ICs for space applications. In our presentation, we provide an overview of our collaboration outcome and our roadmap for further developments in future. © 2021 The Authors
Description
Keywords
Integrated circuits, Radiation effects, Radiation hardness, Semiconductor devices, ANSTO, Experiment results
Citation
Shojaii, J., Pastuovic, Z., & Tan, R., (2021). Radiation test of rad-hard ICs for space applications. Presentation to the ANSTO User Meeting, Online, 24-26 November 2021. Retrieved from: https://events01.synchrotron.org.au/event/146/contributions/4381/contribution.pdf