Radiation test of rad-hard ICs for space applications

dc.contributor.authorShojaii, Jen_AU
dc.contributor.authorPastuovic, Zen_AU
dc.contributor.authorTan, Ren_AU
dc.date.accessioned2023-09-14T06:08:01Zen_AU
dc.date.available2023-09-14T06:08:01Zen_AU
dc.date.issued2021-11-26en_AU
dc.date.statistics2023-04-26en_AU
dc.description.abstractConventional Integrated Circuits (IC) are highly sensitive to radiation effects and can operate only in environments with a very low level of radiation. High radiation environments such as space need custom-designed ICs with dedicated radiation-hardened architectures. Our research is focused on the development and test of radiation-hardened ICs in nanoscale and ultra-low-power semiconductor technologies for high radiation environments such as in space and particle physics experiments. The University of Melbourne and Ansto developed a strategic collaboration to enable the ANSTO's heavy ion microprobe beamline for radiation test of custom-designed ICs for space applications. In our presentation, we provide an overview of our collaboration outcome and our roadmap for further developments in future. © 2021 The Authorsen_AU
dc.identifier.articlenumber167en_AU
dc.identifier.citationShojaii, J., Pastuovic, Z., & Tan, R., (2021). Radiation test of rad-hard ICs for space applications. Presentation to the ANSTO User Meeting, Online, 24-26 November 2021. Retrieved from: https://events01.synchrotron.org.au/event/146/contributions/4381/contribution.pdfen_AU
dc.identifier.conferenceenddate2021-11-26en_AU
dc.identifier.conferencenameANSTO User Meeting 2021en_AU
dc.identifier.conferenceplaceOnlineen_AU
dc.identifier.conferencestartdate2021-11-24en_AU
dc.identifier.urihttps://events01.synchrotron.org.au/event/146/contributions/4381/contribution.pdfen_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15118en_AU
dc.language.isoenen_AU
dc.publisherAustralian Nuclear Science and Technology Organisationen_AU
dc.relation.urihttps://events01.synchrotron.org.au/event/146/contributions/4381/contribution.pdfen_AU
dc.subjectIntegrated circuitsen_AU
dc.subjectRadiation effectsen_AU
dc.subjectRadiation hardnessen_AU
dc.subjectSemiconductor devicesen_AU
dc.subjectANSTOen_AU
dc.subjectExperiment resultsen_AU
dc.titleRadiation test of rad-hard ICs for space applicationsen_AU
dc.typeConference Presentationen_AU
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