Radiation test of rad-hard ICs for space applications
dc.contributor.author | Shojaii, J | en_AU |
dc.contributor.author | Pastuovic, Z | en_AU |
dc.contributor.author | Tan, R | en_AU |
dc.date.accessioned | 2023-09-14T06:08:01Z | en_AU |
dc.date.available | 2023-09-14T06:08:01Z | en_AU |
dc.date.issued | 2021-11-26 | en_AU |
dc.date.statistics | 2023-04-26 | en_AU |
dc.description.abstract | Conventional Integrated Circuits (IC) are highly sensitive to radiation effects and can operate only in environments with a very low level of radiation. High radiation environments such as space need custom-designed ICs with dedicated radiation-hardened architectures. Our research is focused on the development and test of radiation-hardened ICs in nanoscale and ultra-low-power semiconductor technologies for high radiation environments such as in space and particle physics experiments. The University of Melbourne and Ansto developed a strategic collaboration to enable the ANSTO's heavy ion microprobe beamline for radiation test of custom-designed ICs for space applications. In our presentation, we provide an overview of our collaboration outcome and our roadmap for further developments in future. © 2021 The Authors | en_AU |
dc.identifier.articlenumber | 167 | en_AU |
dc.identifier.citation | Shojaii, J., Pastuovic, Z., & Tan, R., (2021). Radiation test of rad-hard ICs for space applications. Presentation to the ANSTO User Meeting, Online, 24-26 November 2021. Retrieved from: https://events01.synchrotron.org.au/event/146/contributions/4381/contribution.pdf | en_AU |
dc.identifier.conferenceenddate | 2021-11-26 | en_AU |
dc.identifier.conferencename | ANSTO User Meeting 2021 | en_AU |
dc.identifier.conferenceplace | Online | en_AU |
dc.identifier.conferencestartdate | 2021-11-24 | en_AU |
dc.identifier.uri | https://events01.synchrotron.org.au/event/146/contributions/4381/contribution.pdf | en_AU |
dc.identifier.uri | https://apo.ansto.gov.au/handle/10238/15118 | en_AU |
dc.language.iso | en | en_AU |
dc.publisher | Australian Nuclear Science and Technology Organisation | en_AU |
dc.relation.uri | https://events01.synchrotron.org.au/event/146/contributions/4381/contribution.pdf | en_AU |
dc.subject | Integrated circuits | en_AU |
dc.subject | Radiation effects | en_AU |
dc.subject | Radiation hardness | en_AU |
dc.subject | Semiconductor devices | en_AU |
dc.subject | ANSTO | en_AU |
dc.subject | Experiment results | en_AU |
dc.title | Radiation test of rad-hard ICs for space applications | en_AU |
dc.type | Conference Presentation | en_AU |