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|Title:||Oxidation of polyethylene implanted with low energy magnesium ions|
Rutherford backscattering spectroscopy
|Citation:||Deslandes, A., Ionescu, M., Karatchevtseva, I., Siegele, R., & Cohen, D. D. (2013). Oxidation of polyethylene implanted with low energy magnesium ions. Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms, 307, 624-629. doi:10.1016/j.nimb.2012.12.103|
|Abstract:||The oxidation of polyethylene implanted with low energy, i.e. 25–50 keV, Mg ions to fluences from 5 × 1012–5 × 1016 ions/cm2 was studied. Rutherford back-scattering spectroscopy showed all implanted samples gained oxygen but the distribution did not match that of the implanted Mg. An increase in carbon content was also observed for the near-surface region. Depth profiles of hydrogen were obtained via elastic recoil detection analysis, showing that hydrogen was lost throughout and beyond the range of the Mg ions, producing unsaturated and chemically active sites available for oxidation. Fourier-transform infrared spectroscopy revealed the formation of carbon–oxygen bonding such as carbonyl groups, but showed no evidence of oxidised magnesium. Raman spectroscopy showed disordered and graphitic carbon bonding configurations were created by the irradiation, but no evidence of oxidised magnesium. The implantation of films to high fluence produced a carbonized surface-layer that made the irradiated polymer more resistant to oxidation. © 2013, Elsevier B.V.|
|Gov't Doc #:||6095|
|Appears in Collections:||Journal Articles|
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