Please use this identifier to cite or link to this item: https://apo.ansto.gov.au/dspace/handle/10238/313
Title: Application of proton induced x-ray emission to the element analysis of thick obsidian samples
Authors: Duerden, P
Cohen, DD
Clayton, E
Keywords: Protons
X-ray emission analysis
ANSTO
Emission spectroscopy
Neutron activation analysis
Issue Date: Nov-1979
Publisher: Australian Atomic Energy Commission
Citation: Duerden, P., Cohen, D., & Clayton, E. (1979). The application of proton induced x-ray emission to the element analysis of thick obsidian samples (AAEC/E475). Lucas Heights, NSW: Research Establishment, Australian Atomic Energy Commission.
Abstract: The proton induced x-ray emission (PIXE) technique has been applied to the analysis of element concentrations in obsidian source samples. No target preparation other than washing and the selection of a flat surface was undertaken. Thick target yields have been calculated and element concentrations derived from the detected X-ray spectra; concentrations are given for K, Ca, Ti, V, Mn, Fe, Ga, As, Rb, Sr, Y, Zr, Nb, Ta, and Pb. A pinhole filter is described which enables a single measurement of about 5 minutes duration to give element concentration data over an x-ray energy range 3-20 keV.
Gov't Doc #: 190
URI: http://apo.ansto.gov.au/dspace/handle/10238/313
ISBN: 0642596794
Appears in Collections:Scientific and Technical Reports

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