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ANSTO Publications Online >
ANSTO Publications >
Scientific and Technical Reports >
Please use this identifier to cite or link to this item:
http://apo.ansto.gov.au/dspace/handle/10238/313
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| Title: | Application of proton induced x-ray emission to the element analysis of thick obsidian samples. |
| Authors: | Duerden, P Cohen, DD Clayton, E |
| Issue Date: | Nov-1979 |
| Publisher: | Australian Nuclear Science and Technology Organisation |
| Abstract: | The proton induced x-ray emission (PIXE) technique has been applied to the analysis of element concentrations in obsidian source samples. No target preparation other than washing and the selection of a flat surface was undertaken. Thick target yields have been calculated and element concentrations derived from the detected X-ray spectra; concentrations are given for K, Ca, Ti, V, Mn, Fe, Ga, As, Rb, Sr, Y, Zr, Nb, Ta, and Pb. A pinhole filter is described which enables a single measurement of about 5 minutes duration to give element concentration data over an x-ray energy range 3-20 keV. |
| URI: | http://apo.ansto.gov.au/dspace/handle/10238/313 |
| ISBN: | 0642596794 |
| Appears in Collections: | Scientific and Technical Reports |
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