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Title: Application of proton induced x-ray emission to the element analysis of thick obsidian samples.
Authors: Duerden, P
Cohen, DD
Clayton, E
Issue Date: Nov-1979
Publisher: Australian Nuclear Science and Technology Organisation
Abstract: The proton induced x-ray emission (PIXE) technique has been applied to the analysis of element concentrations in obsidian source samples. No target preparation other than washing and the selection of a flat surface was undertaken. Thick target yields have been calculated and element concentrations derived from the detected X-ray spectra; concentrations are given for K, Ca, Ti, V, Mn, Fe, Ga, As, Rb, Sr, Y, Zr, Nb, Ta, and Pb. A pinhole filter is described which enables a single measurement of about 5 minutes duration to give element concentration data over an x-ray energy range 3-20 keV.
ISBN: 0642596794
Appears in Collections:Scientific and Technical Reports

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