Please use this identifier to cite or link to this item: https://apo.ansto.gov.au/dspace/handle/10238/11996
Title: M(n+1)AXn phases are they tolerant/resistant to damage
Authors: Whittle, KR
Riley, DP
Blackford, MG
Aughterson, RD
Moricca, SA
Lumpkin, GR
Zaluzec, NJ
Keywords: Materials
Fission
Physical radiation effects
Titanium
Electron microscopy
Beams
Irradiation
Issue Date: 3-Feb-2011
Publisher: Australian Institute of Physics
Citation: Whittle, K. R., Riley, D. P., Blackford, M. G., Aughterson, R. D., Moricca, S., Lumpkin, G. R., & Zaluzec, N. J. (2011). M(n+1)AXn phases are they tolerant/resistant to damage. Poster presented to the Australian and New Zealand Institutes of Physics 35th Annual Condensed Matter and Materials Meeting, Charles Sturt University, Wagga Wagga, NSW, 2nd - 4th February, 2011. Retrieved from: https://physics.org.au/wp-content/uploads/cmm/2011/
Abstract: Ternary carbide materials have been proposed as having applications within the future nuclear technologies, both fusion (ITER/DEMO) and fission (Gen IV). These new designs require a material to have the ability to tolerate radiation damage to high levels, with a high level of predictability. As part of such a process two systems, specifically Ti3AlC2 and Ti3SiC2 have been studied to determine their radiation tolerance, using in-situ ion beam irradiation with 1 MeV Xe ions, coupled with transmission electron microscopy. Irradiations have shown that both systems show little amorphisation at 300K up to doses of at least 6.25 x 1015 ions cm-2 (~28-30 dpa). However, there is a subtle difference between Ti3AlC2 and Ti3SiC2, with Ti3SiC2 showing more evidence for damage. Further irradiations using 500 KeV Xe to fluences equivalent to 100 dpa have also been undertaken, with crystalline material visible and evidence of recrystallisation. Explanations and possible mechanisms for recovery from damage are presented, along with implications for future potential uses.
URI: https://physics.org.au/wp-content/uploads/cmm/2011/
https://apo.ansto.gov.au/dspace/handle/10238/11996
ISBN: 978-0-646-55969-8
Appears in Collections:Conference Publications

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