Polycrystalline materials analysis using the Maia pixelated energy-dispersive x-ray area detector

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dc.contributor.authorKirkwood, HJen_AU
dc.contributor.authorDe Jonge, MDen_AU
dc.contributor.authorHoward, DLen_AU
dc.contributor.authorRyan, CGen_AU
dc.contributor.authorvan Riessen, GAen_AU
dc.contributor.authorHofmann, Fen_AU
dc.contributor.authorRowles, MRen_AU
dc.contributor.authorParadowska, AMen_AU
dc.contributor.authorAbbey, Ben_AU
dc.date.accessioned2021-08-26T22:18:56Zen_AU
dc.date.available2021-08-26T22:18:56Zen_AU
dc.date.issued2017-09-26en_AU
dc.date.statistics2021-08-26en_AU
dc.descriptionPowder Diffraction , Volume 32 , Supplement S2 comprises the Proceedings of the 2017 Australian X-ray Analytical Association workshops, conference, and exhibition.en_AU
dc.description.abstractElemental, chemical, and structural analysis of polycrystalline materials at the micron scale is frequently carried out using microfocused synchrotron X-ray beams, sometimes on multiple instruments. The Maia pixelated energy-dispersive X-ray area detector enables the simultaneous collection of X-ray fluorescence (XRF) and diffraction because of the relatively large solid angle and number of pixels when compared with other systems. The large solid angle also permits extraction of surface topography because of changes in self-absorption. This work demonstrates the capability of the Maia detector for simultaneous measurement of XRF and diffraction for mapping the short- and long-range order across the grain structure in a Ni polycrystalline foil. Copyright © International Centre for Diffraction Data 2017en_AU
dc.identifier.citationKirkwood, H., De Jonge, M., Howard, D., Ryan, C., van Riessen, G., Hofmann, F., Rowles, M. R., Paradowska, A. M., & Abbey, B. (2017). Polycrystalline materials analysis using the Maia pixelated energy-dispersive X-ray area detector. Paper presented to the 2017 Australian X-ray Analytical Association workshops, conference, and exhibition, Melbourne, Victoria, 5 to 9 February 2017. In Powder Diffraction, 32(S2), S16-S21. doi:10.1017/S0885715617000768en_AU
dc.identifier.conferenceenddate9 February 2017en_AU
dc.identifier.conferencename2017 Australian X-ray Analytical Association workshops, conference, and exhibitionen_AU
dc.identifier.conferenceplaceMelbourne, Victoriaen_AU
dc.identifier.conferencestartdate5 February 2017en_AU
dc.identifier.issn1945-7413en_AU
dc.identifier.issueS2en_AU
dc.identifier.journaltitlePowder Diffractionen_AU
dc.identifier.paginationS16-S21en_AU
dc.identifier.urihttps://doi.org/10.1017/S0885715617000768en_AU
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/11518en_AU
dc.identifier.volume32en_AU
dc.language.isoenen_AU
dc.publisherCambridge University Pressen_AU
dc.subjectDiffractionen_AU
dc.subjectTomographyen_AU
dc.subjectSynchrotronsen_AU
dc.subjectX-ray fluorescence analysisen_AU
dc.subjectX-ray diffractionen_AU
dc.subjectPolycrystalsen_AU
dc.titlePolycrystalline materials analysis using the Maia pixelated energy-dispersive x-ray area detectoren_AU
dc.typeConference Paperen_AU
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