Ion beam analysis of GdN thin films with a protective GaN capping layer

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dc.contributor.authorGranville, Sen_AU
dc.contributor.authorBudde, Fen_AU
dc.contributor.authorKoo, Aen_AU
dc.contributor.authorRuck, BJen_AU
dc.contributor.authorTrodahl, HJen_AU
dc.contributor.authorBittar, Aen_AU
dc.contributor.authorMetson, JBen_AU
dc.contributor.authorKennedy, VJen_AU
dc.contributor.authorPrince, KEen_AU
dc.contributor.authorAtanacio, AJen_AU
dc.date.accessioned2021-02-04T01:21:38Zen_AU
dc.date.available2021-02-04T01:21:38Zen_AU
dc.date.issued2005-11-20en_AU
dc.date.statistics2020-01-25en_AU
dc.description.abstractRare-earth nitrides represent an interesting class of matrials that exhibit a range of electronic and magnetic properties. Recent LSD+SIC calculations have predicted magnetic properties covering paramagnetic, ferromagnetic, and antiferromagnetic, and elecronic states including metallic, semiconducting, or insulating, and a number exhibit half-metallicity. Due to this wide variety of predicted properties these materials are of considerable interest as potential sources of spin-polarised current for novel devices. Although numerous studies of the rare-earth nitrides are present in the literature, there is still much to be learned about them. The most well studied of these nitrides is GdN, a ferromagnet with the highest Curie temperature of the series. The magnetic properties in particular have been extensively studied, but often the presence of impurities such as O could not be ruled out, and studies have shown that N vacancies or O impurities significantly influence the magnetic quality of GdN. The rare-earth nitrides are sensitive to water vapour and react rapidly upon exposure to atmosphere, so it is an ongoing challenge to produce GdN of a sufficient purity to make characterising its properties an achievable task. In particular the electrical and optical properties of stoichiometric GdN have not both been established reliably, despite their great relevance to the potential usefulness of the material in devices.en_AU
dc.identifier.citationGranville, S., Budde, F., Koo, A., Ruck, B. J., Trodahl, H. J., Bittar, A., Metson, J. B., Kennedy, V.J., Prince, K.E. & Atanacio, A. (2005). Ion beam analysis of GdN thin films with a protective GaN capping layer. In Bruhn, F. (chair), 14th Australian Conference on Nuclear and Complementary Techniques of Analysis & 8th Vacuum Society of Australia Congress, 20-22 November 2005, Wellington (New Zealand). (pp.137-140 ).en_AU
dc.identifier.conferenceenddate22 November 2005en_AU
dc.identifier.conferencename14th Australian Conference on Nuclear and Complementary Techniques of Analysis & 8th Vacuum Society of Australia Congressen_AU
dc.identifier.conferenceplaceWellington, New Zealanden_AU
dc.identifier.conferencestartdate20 November 2005en_AU
dc.identifier.editorsBruhn, F.en_AU
dc.identifier.isbn0-9758434-0-0en_AU
dc.identifier.pagination137-140en_AU
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/10315en_AU
dc.language.isoenen_AU
dc.publisherAustralian Institute of Nuclear Science and Engineering (AINSE)en_AU
dc.subjectFerromagnetic materialsen_AU
dc.subjectGadoliniumen_AU
dc.subjectGadolinium nitridesen_AU
dc.subjectGalliumen_AU
dc.subjectIon beamsen_AU
dc.subjectMagnetic propertiesen_AU
dc.subjectNitrogen compoundsen_AU
dc.subjectThin filmsen_AU
dc.titleIon beam analysis of GdN thin films with a protective GaN capping layeren_AU
dc.typeConference Paperen_AU
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