Realtime structural characterisation of thin film OLED stacks during thermally induced diffusion - the importance of glass transitions

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dc.contributor.authorNelson, Aen_AU
dc.contributor.authorMcEwan, JAen_AU
dc.contributor.authorClulow, AJen_AU
dc.contributor.authorShaw, PEen_AU
dc.contributor.authorDarwish, TAen_AU
dc.contributor.authorYepuri, NRen_AU
dc.contributor.authorBurn, PLen_AU
dc.contributor.authorGentle, IRen_AU
dc.date.accessioned2021-08-09T22:16:26Zen_AU
dc.date.available2021-08-09T22:16:26Zen_AU
dc.date.issued2017-07-12en_AU
dc.date.statistics2021-08-09en_AU
dc.description.abstractOrganic Light Emitting Diode (OLED) devices are ubiquitous in the displays of many modern electronic devices, including televisions and mobile phones. High efficiency OLEDs are typically made as a sequentially deposited multilayer, with different organic semiconductor layers being required for hole/electron injection/transport, as well as light emission. The operational lifetime, efficiency and fidelity of these OLEDs depends on the structural stability of this multilayer stack, and understanding the factors that affect this stability are crucial in developing new devices. We have systematically characterised the kinetics of structural evolution in these systems as they experience thermally induced diffusion. These leading edge experiments are performed on the Platypus neutron reflectometer, which has been pioneering event mode acquisition techniques to capture quickly changing reflection signals as the multilayers inter-diffuse. Selective deuteration of these semiconductor materials is also critical in providing neutron contrast between each of the layers, without which the experiment could not be carried out. Our investigations reveal the importance of glass transition temperatures on the stability of these OLED systems and provide clear guidelines for material choices when designing new devices. Indeed, with knowledge of each of the T \'s one can predict the way in which diffusion occurs. For example, use of a high Tg emissive layer does not necessarily prevent diffusion from taking place.en_AU
dc.identifier.citationNelson, A., McEwan, J., Clulow, A., Shaw, P., Darwish, T., Yepuri, N. R., Burn, P., & Gentle, I. (2017). Realtime structural characterisation of thin film OLED stacks during thermally induced diffusion - the importance of glass transitions. Paper presented at ICNS 2017 (International Conference on Neutron Scattering), Daejeon, South Korea, 9 to 13 July 2017. Retrieved from: http://www.icns2017.org/program.phpen_AU
dc.identifier.conferenceenddate13 July 2017en_AU
dc.identifier.conferencenameICNS 2017 (International Conference on Neutron Scattering)en_AU
dc.identifier.conferenceplaceDaejeon, South Koreaen_AU
dc.identifier.conferencestartdate9 July 2017en_AU
dc.identifier.urihttp://www.icns2017.org/program.phpen_AU
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/11281en_AU
dc.language.isoenen_AU
dc.publisherInternational Conference on Neutron Scatteringen_AU
dc.subjectElectronic equipmenten_AU
dc.subjectSemiconductor materialsen_AU
dc.subjectLight emitting diodesen_AU
dc.subjectDeuterationen_AU
dc.subjectNeutron reflectorsen_AU
dc.subjectThermal diffusionen_AU
dc.subjectTransition temperatureen_AU
dc.subjectKineticsen_AU
dc.titleRealtime structural characterisation of thin film OLED stacks during thermally induced diffusion - the importance of glass transitionsen_AU
dc.typeConference Abstracten_AU
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