Comparison between calculated and measured photoelectron diffraction patterns for Cu (001)
dc.contributor.author | Cousland, GP | en_AU |
dc.contributor.author | Smith, AE | en_AU |
dc.contributor.author | Riley, JD | en_AU |
dc.contributor.author | Homolya, S | en_AU |
dc.contributor.author | Stampfl, APJ | en_AU |
dc.contributor.author | King-Lacroix, J | en_AU |
dc.date.accessioned | 2021-09-22T01:39:51Z | en_AU |
dc.date.available | 2021-09-22T01:39:51Z | en_AU |
dc.date.issued | 2008-01-30 | en_AU |
dc.date.statistics | 2021-09-01 | en_AU |
dc.description.abstract | We compare the results of X-ray photoelectron diffraction experiments with simulations obtained using the EDAC multiple scattering computer simulation package. Comparisons are presented for Cu (111) at photon energies of ~ 600eV. With an intention to study Cu3Mn, our initial work considers experimental and simulated data for Cu (001) at photon energies from 100 to 380eV. | en_AU |
dc.identifier.citation | Cousland, G. P., Smith, A. E., Riley, J., Homolya, S., Stampfl, A., King-Lacroix, J. (2008). Comparison between calculated and measured photoelectron diffraction patterns for Cu (001). Paper presented to the 32nd Annual Condensed Matter and Materials Meeting, Charles Sturt University, Wagga Wagga, NSW, Wednesday, 30 January - Friday, 1 February 2008. Retrieved from: https://physics.org.au/wp-content/uploads/cmm/2008/ | en_AU |
dc.identifier.conferenceenddate | 1 February 2008 | en_AU |
dc.identifier.conferencename | 32nd Annual Condensed Matter and Materials Meeting | en_AU |
dc.identifier.conferenceplace | Wagga Wagga, NSW | en_AU |
dc.identifier.conferencestartdate | 30 January 2008 | en_AU |
dc.identifier.isbn | 978-0-646-49085-4 | en_AU |
dc.identifier.uri | https://physics.org.au/wp-content/uploads/cmm/2008/ | en_AU |
dc.identifier.uri | https://apo.ansto.gov.au/dspace/handle/10238/11788 | en_AU |
dc.language.iso | en | en_AU |
dc.publisher | Australian Institute of Physics | en_AU |
dc.subject | Photoelectron spectroscopy | en_AU |
dc.subject | Diffraction | en_AU |
dc.subject | X-ray photoelectron spectroscopy | en_AU |
dc.subject | Scattering | en_AU |
dc.subject | Simulation | en_AU |
dc.subject | Photons | en_AU |
dc.subject | Experimental data | en_AU |
dc.subject | Surfaces | en_AU |
dc.subject | Atomic clusters | en_AU |
dc.title | Comparison between calculated and measured photoelectron diffraction patterns for Cu (001) | en_AU |
dc.type | Conference Paper | en_AU |