Top-down patterning of topological surface and edge states using a focused ion beam

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dc.contributor.authorBake, Aen_AU
dc.contributor.authorZhang, Qen_AU
dc.contributor.authorHo, CSen_AU
dc.contributor.authorCauser, GLen_AU
dc.contributor.authorZhao, WYen_AU
dc.contributor.authorYue, ZJen_AU
dc.contributor.authorNguyen, Aen_AU
dc.contributor.authorAkhgar, Gen_AU
dc.contributor.authorKarel, Jen_AU
dc.contributor.authorMitchell, DRGen_AU
dc.contributor.authorPastuovic, Zen_AU
dc.contributor.authorLewis, RAen_AU
dc.contributor.authorCole, JHen_AU
dc.contributor.authorNancarrow, Men_AU
dc.contributor.authorWang, XLen_AU
dc.contributor.authorCortie, DLen_AU
dc.date.accessioned2023-06-16T00:55:52Zen_AU
dc.date.available2023-06-16T00:55:52Zen_AU
dc.date.issued2023-03-27en_AU
dc.date.statistics2023-04-06en_AU
dc.description.abstractThe conducting boundary states of topological insulators appear at an interface where the characteristic invariant ℤ2 switches from 1 to 0. These states offer prospects for quantum electronics; however, a method is needed to spatially-control ℤ2 to pattern conducting channels. It is shown that modifying Sb2Te3 single-crystal surfaces with an ion beam switches the topological insulator into an amorphous state exhibiting negligible bulk and surface conductivity. This is attributed to a transition from ℤ2 = 1 → ℤ2 = 0 at a threshold disorder strength. This observation is supported by density functional theory and model Hamiltonian calculations. Here we show that this ion-beam treatment allows for inverse lithography to pattern arrays of topological surfaces, edges and corners which are the building blocks of topological electronics. Open Access This article is licensed under a Creative Commons Attribution 4.0 © Crown Copyright 2023en_AU
dc.description.sponsorshipWe gratefully acknowledge Peter Evans and Michael Fuhrer for insightful discussions and comments at various stages of the project. We acknowledge Anton LeBrun for technical support with the reflectometry measurements. Abdulhakim Bake gratefully acknowledges a postgraduate research award (PGRA) from the Australian Institute for Nuclear Science and Engineering (AINSE). Q.Z. acknowledges the support of a Women in FLEET Fellowship. D.C. acknowledges the primary support of an ARC DECRA fellowship (DE180100314). This work was partially supported by the ARC Centre for Excellence in Future Low Energy Electronic Technologies (CE170100039). J.K. and G.A. acknowledge funding from Australian Research Council Discovery Project (DP200102477). The work was made possible by the Electron Microscopy Centre at the University of Wollongong and used the FEI Helios G3 CX funded by the ARC LIEF grant (No. LE160100063), JEOL JEM-ARM200F funded by the ARC LIEF grant (No. LE120100104), and the JEOL JEM-F200 funded by the University of Wollongong. We acknowledge the Australian Nuclear Science and Technology Organization for access to research facilities at the Centre for Accelerator Science and funding by the Australian Government through the NCRIS project. High-performance computing was undertaken using the Australian National Computing Infrastructure on the GADI supercomputer.en_AU
dc.identifier.articlenumber1693en_AU
dc.identifier.citationBake, A., Zhang, Q., Ho, C. S., Causer, G. L., Zhao, W., Yue, Z., Nguyen, A., Akhgar, G., Karel, J., Mitchell, D., Pastuovic, Z., Lewis, R., Cole, J. H., Nancarrow, M., Valanoor, N., Wang, X., & Cortie, D. (2023). Top-down patterning of topological surface and edge states using a focused ion beam. Nature Communications, 14(1), 1693. doi:10.1038/s41467-023-37102-xen_AU
dc.identifier.issn2041-1723en_AU
dc.identifier.issue1en_AU
dc.identifier.journaltitleNature Communicationsen_AU
dc.identifier.urihttps://doi.org/10.1038/s41467-023-37102-xen_AU
dc.identifier.urihttps://apo.ansto.gov.au/handle/10238/15059en_AU
dc.identifier.volume14en_AU
dc.language.isoenen_AU
dc.publisherSpringer Natureen_AU
dc.subjectSurfacesen_AU
dc.subjectElectrical insulatorsen_AU
dc.subjectQuantum electronicsen_AU
dc.subjectCrystalsen_AU
dc.subjectIon beamsen_AU
dc.subjectFunctional analysisen_AU
dc.subjectHamiltonian functionen_AU
dc.titleTop-down patterning of topological surface and edge states using a focused ion beamen_AU
dc.typeJournal Articleen_AU
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