Comparative study of neutron reflectometry, x-ray reflectometry and electrical impedance spectroscopy of organic films on silicon

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dc.contributor.authorWong, ELSen_AU
dc.contributor.authorJames, Men_AU
dc.contributor.authorCoster, HGLen_AU
dc.contributor.authorChilcott, TCen_AU
dc.date.accessioned2022-08-15T07:01:22Zen_AU
dc.date.available2022-08-15T07:01:22Zen_AU
dc.date.issued2005-11-27en_AU
dc.date.statistics2022-05-13en_AU
dc.descriptionPhysical copy held by ANSTO Library at DDC 539.7217/2en_AU
dc.description.abstractA comparative study has been made of the substructure and properties of functionalized organic layers on silicon substrates, using neutron reflectivity, X-Ray reflectivity and low frequency electrical impedance spectroscopy (EIS). All three techniques have similar spatial structural resolution. X-Ray reflectometry provides information on the electron density of substructural layers whilst EIS provides data on the electric polarizability and electrical conductance properties of individual substructural layers. Neutron reflectivity likewise provides data on the atomic mass density of the layers. With organic films the contrast in neutron scattering for the elements of interest such as C, O, N is not very large. However, replacement of H2O with D2O allows a much enhanced contrast to be obtained and provides information in particular of the interdigitation of water molecules into film. This impinges on the polarizability and electrical conductance as as measured by EIS. © 2005 The Authorsen_AU
dc.identifier.booktitleFinal Programme and Abstract Booken_AU
dc.identifier.citationWong, E. L. S., James, M., Coster, H. G. L., & Chilcott, T. C. (2005). Comparative study of neutron reflectometry, x-ray reflectometry and electrical impedance spectroscopy of organic films on silicon. Paper presented at the Eighth International Conference on Neutron Scattering ICNS 2005, "Neutrons for structure and dynamics - a new era", Sydney Convention & Exhibition Centre, Sydney, Australia, 27 November-2 December 2005. In Final Programme and Abstract Book, (pp. 135).en_AU
dc.identifier.conferenceenddate2 December 2005en_AU
dc.identifier.conferencenameEighth International Conference on Neutron Scattering ICNS 2005: 'Neutrons for structure and dynamics - a new eraen_AU
dc.identifier.conferenceplaceSydney, Australiaen_AU
dc.identifier.conferencestartdate27 November 2005en_AU
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/13554en_AU
dc.language.isoenen_AU
dc.publisherThe Bragg Institute, Australian Nuclear Science and Technology Organisationen_AU
dc.subjectElectrical propertiesen_AU
dc.subjectElectric impedanceen_AU
dc.subjectOxygen compoundsen_AU
dc.subjectSpectroscopyen_AU
dc.subjectReflectivityen_AU
dc.subjectLayersen_AU
dc.subjectFilmsen_AU
dc.subjectSiliconen_AU
dc.titleComparative study of neutron reflectometry, x-ray reflectometry and electrical impedance spectroscopy of organic films on siliconen_AU
dc.typeConference Abstracten_AU
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