Ion beam analysis techniques

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dc.contributor.authorDytlewski, Nen_AU
dc.contributor.authorSiegele, Ren_AU
dc.contributor.authorCohen, DDen_AU
dc.date.accessioned2021-12-21T02:02:25Zen_AU
dc.date.available2021-12-21T02:02:25Zen_AU
dc.date.issued1998-04-01en_AU
dc.date.statistics2021-11-02en_AU
dc.description.abstractThe international community introduced Ion Beam Analysis (IBA) in the 1950's, principally as an analytical technique for the characterisation of solid materials. Spectacular growth occurred in the subsequent three decades which was made possible by the increasing availability of Van de Graff type accelerators, and the development of semiconductor detector technologies. The demonstrated capabilities of speed, versatility sensitivity and the non-destructive nature of IBA resulted in ion beams being applied to solve problems in many diverse fields such as materials science, biology, geology, medicine and the environment. Whilst much of the low energy and light ion beam techniques are now mature, development of novel instrumentation and techniques using high energy and heavy ion beams is currently a developing field.en_AU
dc.identifier.citationDytlewski, N., Siegle, R., & Cohen, D. D. (1998). Ion beam analysis techniques. Australian and New Zealand Physicist, 35(2), 65-70. Retrieved from https://physics.org.au/wp-content/uploads/Australian%20Physics/Aust%20Phys%2035-2.pdf.en_AU
dc.identifier.issn1036-3831en_AU
dc.identifier.issue2en_AU
dc.identifier.journaltitleAustralian and New Zealand Physicisten_AU
dc.identifier.pagination65-70en_AU
dc.identifier.urihttps://physics.org.au/wp-content/uploads/Australian%20Physics/Aust%20Phys%2035-2.pdfen_AU
dc.identifier.urihttps://apo.ansto.gov.au/dspace/handle/10238/12615en_AU
dc.identifier.volume35en_AU
dc.language.isoenen_AU
dc.publisherAustralian Institute of Physicsen_AU
dc.subjectIon beamsen_AU
dc.subjectSolidsen_AU
dc.subjectSemiconductor detectorsen_AU
dc.subjectVan de Graaff acceleratorsen_AU
dc.subjectNondestructive testingen_AU
dc.subjectHeavy ionsen_AU
dc.titleIon beam analysis techniquesen_AU
dc.typeJournal Articleen_AU
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