Intrinsic reduction of the ordered 4f magnetic moments in semiconducting rare-earth nitride thin films: DyN, ErN, and HoN

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dc.contributor.authorCortie, DLen_AU
dc.contributor.authorBrown, JDen_AU
dc.contributor.authorBrück, Sen_AU
dc.contributor.authorSaerbeck, Ten_AU
dc.contributor.authorEvans, JPen_AU
dc.contributor.authorFritzsche, Hen_AU
dc.contributor.authorWang, XLen_AU
dc.contributor.authorDownes, JEen_AU
dc.contributor.authorKlose, Fen_AU
dc.date.accessioned2016-06-23T06:09:22Zen_AU
dc.date.available2016-06-23T06:09:22Zen_AU
dc.date.issued2014-02-26en_AU
dc.date.statistics2016-06-23en_AU
dc.description.abstractPolarized neutron reflectometry and x-ray reflectometry were used to determine the nanoscale magnetic and chemical depth profiles of the heavy rare-earth nitrides HoN, ErN, and DyN in the form of 15- to 40-nm-thick films. The net ferromagnetic components are much lower than the predictions of density-functional theory and Hund's rules for a simple ferromagnetic ground state in these 4f ionic materials, which points to the intrinsic contribution of crystal-field effects and noncollinear spin structures. The magnetic moment per rare-earth ion was determined as a function of temperature in the range 5–100 K at fields of 1–4 T. It is demonstrated that the films are stoichiometric within 1–3% and magnetically homogeneous on the nanometer scale.© 2014, American Physical Society.en_AU
dc.identifier.articlenumber64424en_AU
dc.identifier.citationCortie, D. L., Brown, J. D., Brück, S., Saerbeck, T., Evans, J. P., Fritzsche, H., Wang, X. L., Downes, J. E., & Klose, F. (2014). Intrinsic reduction of the ordered 4f magnetic moments in semiconducting rare-earth nitride thin films: DyN, ErN, and HoN. Physical Review B, 89(6), 064424. doi:10.1103/PhysRevB.89.064424en_AU
dc.identifier.govdoc6750en_AU
dc.identifier.issn2469-9950en_AU
dc.identifier.issue6en_AU
dc.identifier.journaltitlePhysical Review Ben_AU
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.89.064424en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/7071en_AU
dc.identifier.volume89en_AU
dc.language.isoenen_AU
dc.publisherAmerican Physical Societyen_AU
dc.subjectNeutron reflectorsen_AU
dc.subjectNitratesen_AU
dc.subjectFerromagnetismen_AU
dc.subjectIonsen_AU
dc.subjectX-ray detectionen_AU
dc.subjectSpinen_AU
dc.titleIntrinsic reduction of the ordered 4f magnetic moments in semiconducting rare-earth nitride thin films: DyN, ErN, and HoNen_AU
dc.typeJournal Articleen_AU
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