Few-layer graphene under high pressure: raman and x-ray diffraction studies

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dc.contributor.authorClark, SMen_AU
dc.contributor.authorJeon, KJen_AU
dc.contributor.authorChen, JYen_AU
dc.contributor.authorYoo, CSen_AU
dc.date.accessioned2015-09-28T22:01:18Zen_AU
dc.date.available2015-09-28T22:01:18Zen_AU
dc.date.issued2013-01-01en_AU
dc.date.statistics2015-09-17en_AU
dc.description.abstractThe effect of pressure on the structure of few-layer graphene has been investigated to 50 GPa in both quasi-hydrostatic and non-hydrostatic conditions, using X-ray diffraction and Raman spectroscopy. The results indicate that few-layer graphene loses its long-range order at the critical interlayer distance of ∼2.8 Å (or above ∼18 GPa), while maintaining the local sp2 hybridization in the layer to 50 GPa. This suggests that graphene not only has the highest stability of all graphitic layer structures, but also becomes one of the most healable structures under large stress. © 2012, Elsevier Ltd.en_AU
dc.identifier.citationClark, S. M., Jeon, K. J., Chen, J. Y., & Yoo, C. S. (2013). Few-layer graphene under high pressure: raman and x-ray diffraction studies. Solid State Communications, 154(0), 15-18. doi:10.1016/j.ssc.2012.10.002en_AU
dc.identifier.govdoc6080en_AU
dc.identifier.issn0038-1098en_AU
dc.identifier.journaltitleSolid State Communicationsen_AU
dc.identifier.pagination15-18en_AU
dc.identifier.urihttp://dx.doi.org/10.1016/j.ssc.2012.10.002en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/6235en_AU
dc.identifier.volume154en_AU
dc.language.isoenen_AU
dc.publisherElsevieren_AU
dc.subjectGrapheneen_AU
dc.subjectX-ray diffractionen_AU
dc.subjectRaman spectroscopyen_AU
dc.subjectSynchrotron radiationen_AU
dc.subjectStressesen_AU
dc.subjectHydrostaticsen_AU
dc.titleFew-layer graphene under high pressure: raman and x-ray diffraction studiesen_AU
dc.typeJournal Articleen_AU
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