High pressure single-crystal micro X-ray diffraction analysis with GSE_ADA/RSV software

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dc.contributor.authorDera, Pen_AU
dc.contributor.authorZhuravlev, Ken_AU
dc.contributor.authorPrakapenka, Ven_AU
dc.contributor.authorRivers, MLen_AU
dc.contributor.authorFinkelstein, GJen_AU
dc.contributor.authorGrubor-Urosevic, Oen_AU
dc.contributor.authorTschauner, Oen_AU
dc.contributor.authorClarke, SMen_AU
dc.contributor.authorDowns, RTen_AU
dc.date.accessioned2015-09-29T06:03:34Zen_AU
dc.date.available2015-09-29T06:03:34Zen_AU
dc.date.issued2013-06-17en_AU
dc.date.statistics2015-09-21en_AU
dc.description.abstractGSE_ADA/RSV is a free software package for custom analysis of single-crystal micro X-ray diffraction (SCμXRD) data, developed with particular emphasis on data from samples enclosed in diamond anvil cells and subject to high pressure conditions. The package has been in extensive use at the high pressure beamlines of Advanced Photon Source (APS), Argonne National Laboratory and Advanced Light Source (ALS), Lawrence Berkeley National Laboratory. The software is optimized for processing of wide-rotation images and includes a variety of peak intensity corrections and peak filtering features, which are custom-designed to make processing of high pressure SCμXRD easier and more reliable. © 2013, Taylor & Francis.en_AU
dc.identifier.citationDera, P., Zhuravlev, K., Prakapenka, V., Rivers, M. L., Finkelstein, G. J., Grubor-Urosevic, O., Tschauner, O., Clarke, S. M., & Downs, R. T. (2013). High pressure single-crystal micro X-ray diffraction analysis with GSE_ADA/RSV software. High Pressure Research, 33(3), 466-484. doi:10.1080/08957959.2013.806504en_AU
dc.identifier.govdoc6094en_AU
dc.identifier.issn0895-7959en_AU
dc.identifier.issue3en_AU
dc.identifier.journaltitleHigh Pressure Researchen_AU
dc.identifier.pagination466-484en_AU
dc.identifier.urihttp://dx.doi.org/10.1080/08957959.2013.806504en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/6246en_AU
dc.identifier.volume33en_AU
dc.language.isoenen_AU
dc.publisherTaylor & Francis Ltd.en_AU
dc.subjectX-ray diffractionen_AU
dc.subjectDiamondsen_AU
dc.subjectAdvanced Photon Sourceen_AU
dc.subjectDataen_AU
dc.titleHigh pressure single-crystal micro X-ray diffraction analysis with GSE_ADA/RSV softwareen_AU
dc.typeJournal Articleen_AU
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