Electron backscatter diffraction characterization of plasma immersion ion implantation effects in stainless steel

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dc.contributor.authorDavis, Jen_AU
dc.contributor.authorShort, KTen_AU
dc.contributor.authorWuhrer, Ren_AU
dc.contributor.authorPhillips, MRen_AU
dc.contributor.authorLumpkin, GRen_AU
dc.contributor.authorWhittle, KRen_AU
dc.date.accessioned2015-09-29T02:02:41Zen_AU
dc.date.available2015-09-29T02:02:41Zen_AU
dc.date.issued2013-01-15en_AU
dc.date.statistics2015-09-18en_AU
dc.description.abstractIn these experiments plasma immersion ion implantation is utilised to simulate some of the radiation effects in a nuclear reactor environment. Scanning electron microscopy using the angular selective backscatter detector has revealed observable changes in crystallographic contrast after irradiation with helium ions. Further studies using electron backscatter diffraction in both plan and cross section view allow us to visualize the extent and depth of damage and observe differences in the behavior of different crystalline phases present in several grades of stainless steel. © 2012, Elsevier B.V.en_AU
dc.identifier.citationDavis, J., Short, K., Wuhrer, R., Phillips, M. R., Lumpkin, G. R., & Whittle, K. R. (2013). Electron backscatter diffraction characterization of plasma immersion ion implantation effects in stainless steel. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 295, 38-41. doi:10.1016/j.nimb.2012.10.007en_AU
dc.identifier.govdoc6089en_AU
dc.identifier.issn0168-583Xen_AU
dc.identifier.journaltitleNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atomsen_AU
dc.identifier.pagination38-41en_AU
dc.identifier.urihttp://dx.doi.org/10.1016/j.nimb.2012.10.007en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/6241en_AU
dc.identifier.volume295en_AU
dc.language.isoenen_AU
dc.publisherElsevieren_AU
dc.subjectScanning electron microscopyen_AU
dc.subjectIon implantationen_AU
dc.subjectElectron microscopyen_AU
dc.subjectCrystallographyen_AU
dc.subjectElectron diffractionen_AU
dc.subjectStainless steelsen_AU
dc.titleElectron backscatter diffraction characterization of plasma immersion ion implantation effects in stainless steelen_AU
dc.typeJournal Articleen_AU
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