Introduction to the special issue for the 15th International Conference on Small-Angle Scattering (SAS2012)

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dc.contributor.authorGilbert, EPen_AU
dc.contributor.authorAllen, AJen_AU
dc.date.accessioned2016-08-15T06:22:59Zen_AU
dc.date.available2016-08-15T06:22:59Zen_AU
dc.date.issued2014-01-30en_AU
dc.date.statistics2016-08-15en_AU
dc.description.abstractThe scientific publishing landscape is changing. Over the past few meetings of the small-angle scattering community, it has become challenging for conference organizers to publish traditional volumes of proceedings in scientific journals without impacting on metrics of concern to many publishing houses, namely impact factor, despite an expressed need to have proceedings. Equally, many scientists would choose not to submit their findings to proceedings and wish to communicate their work in high-impact-factor journals only. From broadly canvassing the community, it has become evident that both proceedings and selected articles have their own rightful place and are valuable sources of reference for both the newcomer to the field and established researchers alike. As such, for the first time, the organizers of the small-angle scattering conference have published both proceedings (McGillivray et al., 2012) – reflecting the full content of the meeting and reviewed to the extent that the work has been selected for conference presentation – and, here, a special issue in what many would consider to be the traditional and natural home for small-angle scattering, namely Journal of Applied Crystallography. The production of this special issue has been a painstaking process. Attendees were invited to submit articles on the basis that, not only would their work be exposed to rigorous review but, even then, only selected articles would be published. The refereeing process was strict and thorough, many papers were rejected, and all were improved. We are grateful to all the authors that submitted material, whether selected or not, as well as the Guest Co-editors – Andrew Jackson, Yoshiyuki Amemiya, Charles Dewhurst, Dmitri Svergun and Aldo Craievich – the many referees for their invaluable effort which made the publication of this special issue possible and, indeed, the entire scientific programme committee that developed such a compelling programme. We would also like to thank Lisa Stephenson and Peter Strickland at the IUCr Editorial Office in Chester, UK, for their support and guidance. The resulting compilation provides an excellent overview of the state of the art across the spectrum of small-angle neutron and X-ray scattering (SANS and SAXS), covering the fields of application, theory, methods of analysis and instrumentationen_AU
dc.identifier.citationGilbert, E. P., & Allen, A. J. (2014). Introduction to the special issue for the 15th International Conference on Small-Angle Scattering (SAS2012). Journal of Applied Crystallography, 47(1), 1-3. doi:10.1107/S1600576714001770en_AU
dc.identifier.govdoc6946en_AU
dc.identifier.issn1600-5767en_AU
dc.identifier.issue1en_AU
dc.identifier.journaltitleJournal of Applied Crystallographyen_AU
dc.identifier.pagination1-3en_AU
dc.identifier.urihttp://dx.doi.org/10.1107/S1600576714001770en_AU
dc.identifier.urihttp://apo.ansto.gov.au/dspace/handle/10238/7302en_AU
dc.identifier.volume47en_AU
dc.language.isoenen_AU
dc.publisherInternational Union of Crystallographyen_AU
dc.subjectX-ray sourcesen_AU
dc.subjectMeetingsen_AU
dc.subjectScatteringen_AU
dc.subjectCrystallographyen_AU
dc.subjectCommunitiesen_AU
dc.subjectProceedingsen_AU
dc.titleIntroduction to the special issue for the 15th International Conference on Small-Angle Scattering (SAS2012)en_AU
dc.typeJournal Articleen_AU
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